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Showing 1 to 4 of 4 for “"scanning probe microscope (SPM)"”.

  1. Characterization of mirco/nano mechanical and tribological properties of polymeric coatings deposited on steel

    … a nano-indenter and analyzing the results with a Scanning Probe Microscope (SPM). Results of indentation tests show that melamine, with a hardness of 0.164 GPa and a modulus of 3.367 GPa, was both the hardest and stiffest of the three coatings, while the 2K coating, with a hardness of .104 GPa and …

    emich Repository record for Characterization of mirco/nano mechanical and tribological properties of polymeric coatings deposited on steel (opens in a new tab)

  2. Studying scratching/buffing mechanism of the clearcoats and improving the technique and devices/materials in automobile refinish work

    … nano instruments, a Nano-Indenter XP and a Scanning Probe Microscope (SPM). This study has increased our knowledge of the scratching and buffing mechanism of coatings and the refinish process, thus shedding light on the direction for improvement of the technique and devices/materials in the …

    emich Repository record for Studying scratching/buffing mechanism of the clearcoats and improving the technique and devices/materials in automobile refinish work (opens in a new tab)

  3. Dynamic Atomic Force Microscopy and applications in biomolecular imaging

    The Atomic Force Microscope (AFM) is a key member of the Scanning Probe Microscope (SPM) family. Its versatility allows it to image and manipulate nanoscale features with high precision, making it one of the main instruments in nanotechnology for surface characterization. The aim of this thesis is …

    whiterose Repository record for Dynamic Atomic Force Microscopy and applications in biomolecular imaging (opens in a new tab)

  4. X-ray microscope performance enhancement through control architecture change

    … noise attenuation. Conveniently, the field of scanning probe microscopes (SPMs) have already flourished on this aspect of controller algorithms proven to give desired closed-loop properties. Controller algorithms such as Proportional Integral Derivative (PID), Glover-McFarlane H-infinty …

    uiuc Repository record for X-ray microscope performance enhancement through control architecture change (opens in a new tab)