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Showing 1 to 2 of 2 for “"sample tilt"”.
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Ions and the calcite-water (10.4) interface - investigated with three-dimensional atomic force microscopy
… reversible correction tools for *z*-drift, sample tilt and the static deflection are introduced. Also, updated extraction and export methods are presented, as well as a collection of minor implementations.<br /> Regarding the impact of the static deflection on dynamical 3D AFM data, it is …
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Feasibility of Ellipsometric Sensor Development for Use During PECVD SiOx Coated Polymer Product Manufacturing
… the characterization experiments, NS3 provided samples, both SiOX coated and uncoated, of various deposition thicknesses on silicon and biaxially oriented PET substrates. Null ellipsometry was used in conjunction with spectroscopic reflectometry to characterize the refractive index and thickness …