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Showing 1 to 1 of 1 for “"sX-LDA"”.
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Density Functional Simulations of Defect Behavior in Oxides for Applications in MOSFET and Resistive Memory
Defects in the functional oxides play an important role in electronic devices like metal oxide semiconductor field effect transistors (MOSFETs) and resistive random-access memories (ReRAMs). The continuous scaling of CMOS has brought the Si MOSFET to its physical technology limit and the …