NDLTD logo NDLTD Union Catalog and Global ETD Search

Global ETD Search

Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.

Results

Showing 1 to 4 of 4 for “"sMIM"”.

  1. Characterization of electrical conductivity of carbon fiber/epoxy composites with conductive AFM and scanning microwave impedance microscopy

    McKenzie, Andrew B.University of Illinois at Urbana-Champaign2015

    … and Scanning Microwave Impedance Microscopy (sMIM). Unidirectional IM7/977-3 carbon fiber/epoxy laminates were manufactured and examined with these two techniques. C-AFM was used to measure the bulk resistivity of IM7 fibers at (1.9 ± 1.1) x 10-3 Ω∗cm. Given that the uncertainty of these …

    uiuc Repository record

  2. Development of a multipurpose near-field imaging platform

    Liu, LigeMassachusetts Institute of Technology2021

    … such as scanning microwave impedance microscopy (sMIM).

    mit Repository record

  3. Advanced characterization of 4H-SiC MOSFET channel [Caratterizzazione avanzata del canale 4H-SiC MOSFET]

    ZIGNALE, MARCOUniversità degli studi di Catania2025

    … microscopia a impedenza a microonde a scansione (sMIM). Questi metodi complementari hanno permesso di determinare le distribuzioni locali di drogaggio, l'estensione del canale attivo e lo spessore del dielettrico, fornendo così un confronto diretto con le specifiche di progetto. L'applicazione …

    catania Repository record

  4. Bottom-up growth of III-V compound semiconductor nanowires by selective lateral/area epitaxy

    Choi, WonsikUniversity of Illinois at Urbana-Champaign2020

    Submission published under a 24 month embargo labeled 'Closed Access', the embargo will last until 2021-12-01

    uiuc Repository record