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Showing 1 to 4 of 4 for “"radiation damages"”.
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Integration of the end cap TEC+ of the CMS silicon strip tracker
… of the foreseen life time of the end cap, when radiation damages will lead to higher noise and reduced signal charge collection. During the integration phase, sub-structures of the end cap – named petals – were subjected to a reception test which has also been designed and operated as part of …