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Showing 1 to 1 of 1 for “"printed circuit test"”.
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Improved Signal Integrity in IEEE 1149.1 Boundary Scan Designs
… at the board level in conjunction with its test system. Setup or hold times violations may occur in a boundary scan chain using IEEE 1149.1 compliant devices. A practical study of the TDI-TDO scan data path has been conducted to show where problems may arise in relationship to a particular …