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Showing 1 to 2 of 2 for “"photo-induced force"”.
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Development of Atomic Force Microscopy Modalities Using Dissipation Signal for Enhancing the Sensitivity of Photo-Induced Force Detection
… we focus on one tool in particular, the atomic force microscope (AFM). The AFM is highly versatile regarding the ability to implement many different characterization methods in ambient conditions, under vacuum, and liquid immersion conditions. Among these techniques exists spectroscopic scanning …
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Reconfigurable strain engineering of atomically-thin van der Waals materials
Submission published under a 24 month embargo labeled 'Closed Access', the embargo will last until 2024-12-01