Global ETD Search

Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.

Results

Showing 1 to 1 of 1 for “"pattern volume"”.

  1. Experimental Study of Scan Based Transition Fault Testing Techniques

    … exist organized techniques to generate test patterns for the transition fault model and the two popular methods being used are Broad-side delay test (Launch-from-capture) and Skewed load delay test (Launch-from-shift). Each method has its own drawbacks and many practical issues are associated …

    vt Repository record for Experimental Study of Scan Based Transition Fault Testing Techniques (opens in a new tab)