Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 4 of 4 for “"oxide trap"”.
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Investigations of the Electric Field Dependencies of the Generation Rates of Oxide and Interface Traps on Silicon
… the electric field dependencies of the oxide and interface trap generation and charging on oxidized silicon film on silicon. The substrate emitter/base junction is forward-biased to independently control the current injected into the gate oxide and the potential drop across the oxide. A …
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HfO2 as gate dielectric on Si and Ge substrate
Hafnium oxide HfO_2 has been considered as an alternative to silicon dioxide SiO_2 in future nano-scale complementary metal-oxide-semiconductor (CMOS) devices since it provides the required capacitance at the reduced device size because of its high dielectric constant. HfO_2 films are currently …
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Characterization and Modeling of Low Frequency Noise and Dielectric Traps in Scaled MOSFET Devices
… and reduce short channel effects. However, the oxide trap density in these materials is intrinsically higher and that leads to stronger trapping effects. This dissertation describes the modeling and electrical characterization of nanoscaled high-K and SiON MOSFET devices, focusing on their …
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Generation and annealing of the bulk compensating donor, peaked interface donor, donorlike turn-around trap, and oxide traps on oxidized silicon
Submitted by Carolyn Mead (cmead2@illinois.edu) on 2011-06-09T14:12:57Z No. of bitstreams: 1 1983_tzou.pdf: 5644065 bytes, checksum: 7d02b875f418796fc13f2f8cad1e55f8 (MD5)