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Showing 1 to 2 of 2 for “"optical ellipsometry"”.
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Investigation of growth kinetics of self-assembling monolayers by means of contact angle, optical ellipsometry, angle-resolved XPS and IR spectroscopy.
… has been studied by means of contact angle, optical ellipsometry, angle-resolved XPS (ARXPS), and with grazing angle total reflection FTIR. Growth of the monolayers from dilute solutions has been monitored and Langmuir isotherm adsorption curves were fitted to experimental data. A saturated …
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A comparative study of metrology techniques for porous organic thin films
… Scanning Electron Microscopy; indirect, such as optical ellipsometry and X-Ray Reflectivity; or pose problems for industrial use, involving radioactivity such as Positronium Annihilation Lifetime Spectroscopy and Small Angle Neutron Scattering. Atomic Force Microscopy is limited to surface …