Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 4 of 4 for “"non-destructive determination"”.
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Characterisation of solution processed zinc oxide quasi-superlattice materials for thin film applications
… are presented. An accurate method for the non-destructive determination of film thickness was derived using UV/vis/NIR reflectance data, agreeing very well with measured thickness of 1 to 20 layered thin films from transmission electron microscopy. Optoelectronic properties of solution …
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Metrology of very thin silicon epitaxial films
In this thesis, non-destructive thickness measurement of sub-0.5 µm silicon epitaxial films has been successfully performed using spectroscopic ellipsometry (SE) in the visible to near infrared (NIR) range (0.73 - 3.3 eV). The undoped epitaxial .films are grown on heavily doped substrates by …
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Development of procedures for performance measurements and lifetime testing of thin film photovoltaic devices
… accelerated lifetime testing. The method enables non-destructive determination of position dependent photocurrent throughout the module. It is suggested to use a reference device with a spectral response similar to that of the sample material to reliably measure the electrical characteristics of …
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Nuclear Magnetic Resonance Characterization of Soybeans for Oil Content Measurment
Made available in DSpace on 2017-07-06T18:49:04Z (GMT). No. of bitstreams: 3 Klempir_James_M_MS.pdf: 35022043 bytes, checksum: 0f0f732118c227773dbdf6671686f5e6 (MD5) Klempir_James_M_MS_ABS.pdf: 595564 bytes, checksum: a5d5079781a319a1e1e65f284b91d688 (MD5) license.txt: 4813 bytes, checksum: …