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Showing 1 to 20 of 63 for “"negative bias"”.

  1. Negative bias temperature instability (NBTI) experiment

    The phenomenon known as Negative Bias Temperature Instability (NBTI) impacts the operational characteristics of Complementary Metal Oxide Semiconductor (CMOS) devices, and tends to have a stronger effect on p-channel devices. This instability is observed with an applied "on" biasing during normal …

    nps Repository record for Negative bias temperature instability (NBTI) experiment (opens in a new tab)

  2. Development of characterization techniques for negative bias temperature instabilities

    … issues for the current CMOS technology is the negative bias temperature instability (NETI). This project will focus on investigating the NBTI and the positive charges responsible for it. Modem MOSFETs use gate dielectrics in the nanometer range and the degradation will recover rapidly. To …

    liverpool-jm Repository record for Development of characterization techniques for negative bias temperature instabilities (opens in a new tab)

  3. FUNDAMENTAL ISSUE IN SPACE ELECTRONICS RELIABILITY: NEGATIVE BIAS TEMPERATURE INSTABILITY

    Negative Bias Temperature Instability (NBTI) in silicon based metal-oxide-semiconductor-field-effect-transistors (MOSFETs) has been recognized as a critical reliability issue for advanced space qualified electronics. The phenomenon manifests itself as a modification of threshold voltage (Vth) …

    unm Repository record for FUNDAMENTAL ISSUE IN SPACE ELECTRONICS RELIABILITY: NEGATIVE BIAS TEMPERATURE INSTABILITY (opens in a new tab)

  4. Characterization of negative bias temperature instability and lifetime prediction for pMOSFETs

    … in silicon oxynitrides (SiON) increases, the negative bias temperature instability (NBTI) rises and becomes a limiting factor for device lifetime. The NBTI can recover significantly during typical measurement time when using conventional instruments. To suppress this recovery, several fast …

    liverpool-jm Repository record for Characterization of negative bias temperature instability and lifetime prediction for pMOSFETs (opens in a new tab)

  5. Explicit and Implicit Attitude Tests Examining Attitude Towards Obese People Among Undergraduate Psychology Students

    … on conscious or explicit attitudes which may be biased by social desirability. Therefore, the present study examined both explicit and implicit, that are considered to be unconscious, attitudes towards obese individuals. A sample of 46 undergraduate psychology students participated in the study. …

    reykjavik Repository record for Explicit and Implicit Attitude Tests Examining Attitude Towards Obese People Among Undergraduate Psychology Students (opens in a new tab)

  6. Affective Reactions, Social Support and Willingness to Self-Disclose to HIV Seropositive Individuals: Impact of Sexual Orientation and Responsibility for the Infection

    … other measures. Overall, subjects reported more negative affect and less trust for a homosexual versus heterosexual HIV positive individual. Subjects also responded more intimately to a heterosexual HIV positive person than to a homosexual HIV positive individual. Subjects reported feeling more …

    odu Repository record for Affective Reactions, Social Support and Willingness to Self-Disclose to HIV Seropositive Individuals: Impact of Sexual Orientation and Responsibility for the Infection (opens in a new tab)

  7. The Degradation and Time-dependent Breakdown of P-type Mosfets with a High-k Dielectric

    … comprised of SiO2/HfO2/TiN was investigated. Negative bias constant voltage stress was applied in conjunction with charge pumping, stress induced leakage current, and carrier separation measurements to examine the trap generation phenomena. Of interest in the study was location of the trap …

    texas-state Repository record for The Degradation and Time-dependent Breakdown of P-type Mosfets with a High-k Dielectric (opens in a new tab)

  8. Electrical characterization of large-area donor-acceptor molecular junctions

    … Janus effect of the current enhancement. At low bias (V < ±1.5 V) more current passes at positive bias than at negative bias but switches to more current passing at negative bias than at positive bias at higher voltage (V > ±2.0 V). The largest bias that provided stable molecular junctions was …

    alabama Repository record for Electrical characterization of large-area donor-acceptor molecular junctions (opens in a new tab)

  9. The Impact of Prefrontal Cortex "Warm Up" on Immediate Cognitive Reappraisal Ability in Older Adolescents with Elevated Symptoms of Depression

    … However, current level of depression predicted negative bias and sadness ratings after CR instructions, and this effect was qualified by an interaction with condition. The moderator analysis showed that depressive symptoms interacted with condition such that in the control condition, …

    denver Repository record for The Impact of Prefrontal Cortex "Warm Up" on Immediate Cognitive Reappraisal Ability in Older Adolescents with Elevated Symptoms of Depression (opens in a new tab)

  10. Specificity, Emotional Valence, and the Relationship between the Past and the Future in Depression

    … quality (i.e., overgenerality) and predominantly negative in emotional valence (i.e., negative bias). The studies in this thesis investigate the nature of specificity and emotional valence of both past and future autobiographical events in MDD. In Study 1, we investigated the specificity of both …

    auckland-ms Repository record for Specificity, Emotional Valence, and the Relationship between the Past and the Future in Depression (opens in a new tab)

  11. Phase Noise in CMOS Phase-Locked Loop Circuits

    … different types of PLL designs. Hot carrier and negative bias temperature instability effects are analyzed from simulations and experiments. Phase noise of a CMOS phase-locked loop as a frequency synthesizer circuit is modeled from the superposition of noises from its building blocks: …

    lsu-thes Repository record for Phase Noise in CMOS Phase-Locked Loop Circuits (opens in a new tab)

  12. Ion flux maps and helicon source efficiency in the VASIMR VX-100 experiment using a moving Langmuir probe array

    … section. Neutral input flow and probe collector bias voltage were scanned from pulse to pulse in an effort to find optimal settings. Secondary electron emission was found to be an important factor that artificially enhanced the measured flux at large negative bias voltages. The most accurate bias

    rice Repository record for Ion flux maps and helicon source efficiency in the VASIMR VX-100 experiment using a moving Langmuir probe array (opens in a new tab)

  13. Bias in Closed Population Capture-Recapture

    … the initial results and observing substantial negative bias (underestimates), we attempted to model the bias for M0 and Mb capture scenarios as these situations had consistent patterns. The Mt scenario with its erratic behaviors was not modeled. We noted that M0 and Mt performed equally well …

    gsu Repository record for Bias in Closed Population Capture-Recapture (opens in a new tab)

  14. Selected topics on advanced electron devices and their circuit applications

    … passive devices.I part I, a systematic study of Negative Bias Temperature Instability (NBTI) in p-MOSFETs with ultra-thin SiON gate dielectric is reported. By using the fast pulsed method, a fast Dynamic NBTI (DNBTI) component is distinguished from the conventional slow one for the first time. …

    nus Repository record for Selected topics on advanced electron devices and their circuit applications (opens in a new tab)

  15. The [flourishing] entrepreneur: a case for legislative intervention to support healthy SMME financial access in South Africa

    … structures in the retail banking sector are negatively biased towards the black population group. This has an adverse impact on black entrepreneurs. It is suggested in this thesis that this negative bias is a consequence of apartheid. Apartheid had the effect of regulating the access that …

    cape-town Repository record for The [flourishing] entrepreneur: a case for legislative intervention to support healthy SMME financial access in South Africa (opens in a new tab)

  16. A synthetic hydrologic flow model for the upper James River Basin

    … eight reservoir sizes was found. The model had a negative bias of approximately thirteen percent. This bias appeared to be alleviated when the dependable flow was expressed as a percent of the average flow for the period in question. It appears that there is great variability in the estimated …

    vt Repository record for A synthetic hydrologic flow model for the upper James River Basin (opens in a new tab)

  17. Experimental Analysis on Aging of Integrated Circuits

    … of CMOS devices, reliability issues such as negative bias temperature instability (NBTI), hot carrier injection (HCI), time dependent dielectric breakdown (TDDB), and electromigration (EM) are coming up as potential threats to superior performance in the field. All these reliability issues …

    uconn-diss Repository record for Experimental Analysis on Aging of Integrated Circuits (opens in a new tab)

  18. Preparation and Characterization of Ferroelectric Thin Films for Tunable and Pyroelectric Applications

    … (SCLC) behavior at positive bias while interface-limited Fowler-Nordheim (FN) tunneling at negative bias. For the Pt/BTS/Pt structure, the dominant conduction mechanism is mainly controlled by the bulk-limited SCLC and/or Poole-Frenkel (PF) emission. We have studied …

    nus Repository record for Preparation and Characterization of Ferroelectric Thin Films for Tunable and Pyroelectric Applications (opens in a new tab)

  19. Reliability Studies of TiN/Hf-Silicate Based Gate Stacks

    … shallow levels or trap-assisted tunneling due to negative- U transition occurs depending on bias condition. The former gives rise to fast transient trapping, whereas the latter is responsible for slow transient trapping. Mixed degradation, due to trapping of both electrons and holes in the trap …

    njit Repository record for Reliability Studies of TiN/Hf-Silicate Based Gate Stacks (opens in a new tab)

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