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Showing 1 to 7 of 7 for “"near-field microscopy"”.
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Building practical apertureless scanning near-field microscopy
… functional, practical apertureless type scanning near-field optical microscope, and to figure out the working mechanism behind it. Whereas a far-field microscope can measure the propagating field’s components, this gives us little information about the features of the sample. The resolution is …
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Measurement of the local optical phase and amplitude in photonic devices using scanning near-field microscopy
… of various photonic devices using scanning near-field microscopy (SNOM). The SNOM technique has a unique capability of achieving a resolution beyond the diffraction limit. Placing the SNOM into the arm of a heterodyne interferometer also enables the measurement of both the optical phase and …
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An investigation of phase-mask diffraction patterns and fibre Bragg gratings with scanning near-field optical microscopy
In recent years, near-field microscopy has been utilized for assessing the properties of optical wave-guides at an increasing rate. Here, a Scanning Near-field Optical Microscope (SNOM) has been designed and constructed in order to expand this work into an analysis of the optical and structural …
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Numerical Study of Plasmon Resonances in Nanoparticles
… applications in such areas as nanophotonics, near-field microscopy, nano-lithography, biosensor, metamaterial and optical data storage. Consequently, the understanding of plasmon resonances in nanoparticles has both fundamental and practical significance. In this dissertation, a new numerical …
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Coherence Properties Of Optical Near-fields
… In this dissertation, concepts specific to near-field optics and experimental capabilities specific to near-field microscopy are used to investigate various aspects of the statistical properties of random electromagnetic fields in the vicinity of optically inhomogeneous media which emit or …
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Scanning near-field photon emission microscopy
… of fault isolation techniques, like far-field photon emission microscopy (FFPEM), is grossly inadequate for advanced semiconductor technology nodes beyond 65 nm. The fundamental limit on spatial resolution of FFPEM is approximately half the wavelength of the detected photons. The …
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Scattering Scanning Near-Field Optical Microscopy on Anisotropic Dielectrics
Near-field optical microscopy allows the nondestructive examination of surfaces with a spatial resolution far below the diffraction limit of Abbe. In fact, the resolution of this kind of microscope is not at all dependent on the wavelength, but is typically in the range of 10 to 100 nanometers. On …