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Showing 1 to 4 of 4 for “"nanopositioning system"”.

  1. Design of a low-cost meso-scale, detachable fixturing system for probe-based nanomanufacturing equipment and instruments

    … meso-scale, detachable kinematic fixturing system for use in alignment in probe-based nanomanufacturing. The fixturing system will be applied specifically to a nanopositioning system developed for the functionalization of DNA via dip pen nanolithography. A ball and groove kinematic coupling …

    mit Repository record for Design of a low-cost meso-scale, detachable fixturing system for probe-based nanomanufacturing equipment and instruments (opens in a new tab)

  2. Application of field programmable analog arrays (FPAAs) to fast scanning probe microscopy

    … Therefore AFMs are required to have very fast nanopositioning systems. However, high-bandwidth requirement on the positioning system poses fundamental limitations on the image resolution. The resolution of an image depends on the controller’s capabilities to attenuate the measurement noises. …

    uiuc Repository record for Application of field programmable analog arrays (FPAAs) to fast scanning probe microscopy (opens in a new tab)

  3. Advanced control of MEMS probing devices

    This work is aimed at developing a control-system theoretic approach for addressing certain performance issues that arise in micro-electro-mechanical systems (MEMS). In particular, it focuses on applications such as nano-positioning, where control design becomes necessary to meet high resolution, …

    uiuc Repository record for Advanced control of MEMS probing devices (opens in a new tab)

  4. X-ray microscope performance enhancement through control architecture change

    … control algorithms to improve the performance of nanopositioning devices used on the beamline in Advanced Photon Source (APS) at Argonne National Laboratory (ANL). A prototype device, better known as the Early User Instrument (EUI) was the subject of this work. It consists of X-ray optics stage …

    uiuc Repository record for X-ray microscope performance enhancement through control architecture change (opens in a new tab)