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Showing 1 to 1 of 1 for “"multislics simulations"”.
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Quantitative High-angle Annular Dark Field Scanning Transmission To Electron Microscopy For Materials Science
… mode is used in combination with multislice simulations. This combination is applied to the investigation of the temperature dependence of the intensity collected by the HAADF detector in silicon, and to convergent beam electron diffraction (CBED) to measure the degree of chemical order in …