Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 5 of 5 for “"multi-microscopy"”.
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Multi-Microscopy Characterisation of III-Nitride Devices and Materials
… or cathodoluminescence, whilst traditional microscopy techniques such a transmission electron microscopy and scanning electron microscopy are used to elucidate their structure and composition. This thesis describes the use of a dual-beam focussed ion beam/scanning electron microscope …
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Development of Multi-Microscopy Techniques for the Characterisation of Nitride Semiconductors
… on the same nanoscale feature between different microscopy techniques can allow a deeper understanding of the interplay between the structural, optical and electronic properties and is termed ‘multi-microscopy’. In this work, after reviewing the basic material properties and the characterisation …
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Machine Learning for Materials Science
… for the association of simulations to detailed multi-microscopy. In the following chapters 5 to 7, it is shown that machine learning can leverage the use of device simulations, by replacing in a targeted and efficient way the very labour intensive tasks of making sure the numerical parameters of …
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Nanoscale electrical characterisation of nitride structures
… device performances. Electrical scanning probe microscopy techniques, including scanning capacitance microscopy (SCM), conductive atomic force microscopy (C-AFM) and kelvin probe force microscopy (KPFM), were utilized to study the structures of nitride devices such as high electron mobility …
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Structure-Property Relationships in Nitride Electronic Devices
… relationships. Scanning capacitance microscopy (SCM) is an AFM-based technique that provides access to information about the electrical properties of semiconductors. This thesis describes the development of a series of SCM-based techniques for plan-view and cross-sectional GaN-based …