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Showing 1 to 20 of 29 for “"metal-insulator-semiconductor"”.

  1. Stability of polarization in organic ferroelectric metal-insulator-semiconductor structures

    … as the gate insulator. Dielectric measurements have been carried out on all-organic metal-insulator-semiconductor structures with the ferroelectric polymer poly(vinylidenefluoride-trifluoroethylene) (P(VDF-TrFE)) as the gate insu-lator. The capacitance spectra …

    potsdam-diss Repository record for Stability of polarization in organic ferroelectric metal-insulator-semiconductor structures (opens in a new tab)

  2. Dielectric reliability in GaN metal-insulator-semiconductor high electron mobility transistors

    GaN Metal Insulator Semiconductor High Electron Mobility Transistors (GaN MIS-HEMTs) show excellent promise as high voltage power transistors that can operate efficiently at high temperatures and frequencies. However, current GaN technology faces several obstacles, one of which is Time-Dependent …

    mit Repository record for Dielectric reliability in GaN metal-insulator-semiconductor high electron mobility transistors (opens in a new tab)

  3. High-bias studies on metal-insulator-metal and metal-insulator-semiconductor tunnel junctions

    … oxide interface can be thought of as a narrow ""semiconductor transition region"" separating the metal and the oxide. The aluminum-aluminum oxide interface is adequately characterized by a shallow impurity band. The high-bias behavior of silicon junctions is qualitatively described in terms of …

    uiuc Repository record for High-bias studies on metal-insulator-metal and metal-insulator-semiconductor tunnel junctions (opens in a new tab)

  4. Growth and electronic properties of gallium arsenide and germanium metal insulator semiconductor structures

    The metal insulator semiconductor (MIS) structure is arguably the most technologically important type of solid in existence. The microelectronics revolution of the last thirty years is made possible largely due to the ability to realize extremely high quality metal/SiO$\sb2$/Si metal oxide …

    uiuc Repository record for Growth and electronic properties of gallium arsenide and germanium metal insulator semiconductor structures (opens in a new tab)

  5. Dielectric reliability in high-voltage GaN metal-insulator-semiconductor high electron mobility transistors

    … power management applications. The AlGaN/GaN Metal-Insulator-Semiconductor High Electron Mobility Transistor (MIS-HEMT) constitutes the most suitable device structure for this application as it offers lower gate leakage than its HEMT counterpart. GaN has excellent material properties, but …

    mit Repository record for Dielectric reliability in high-voltage GaN metal-insulator-semiconductor high electron mobility transistors (opens in a new tab)

  6. Electron Interactions With Local and Resonant Mode Phonons in Metal - Insulator -Semiconductor Tunnel Junctions

    Made available in DSpace on 2015-05-12T22:38:42Z (GMT). No. of bitstreams: 2 license.txt: 4848 bytes, checksum: 96035ab3f5e1c23cc7138a224ce498bd (MD5) 7121221.PDF: 3366996 bytes, checksum: 9591afd038bec2dc367f211b8b3e6b7b (MD5) Previous issue date: 1971

    uiuc Repository record for Electron Interactions With Local and Resonant Mode Phonons in Metal - Insulator -Semiconductor Tunnel Junctions (opens in a new tab)

  7. Time dependent dielectric breakdown in novel GaN metal-insulator-semiconductor high electron mobility transistors

    … into mainstream electric vehicles. Recently, GaN metal-insulator-semiconductor high electron mobility transistors (MIS-HEMTs) have been increasing in popularity for high voltage power electronics applications because they combine high electron mobility with low gate leakage, increasing efficiency. …

    mit Repository record for Time dependent dielectric breakdown in novel GaN metal-insulator-semiconductor high electron mobility transistors (opens in a new tab)

  8. Deposition and Characterization of Silicon Nitride/gallium Arsenide Metal Insulator Semiconductor Structures With Heteroepitaxial Interlayers

    … Electrical measurements examining the insulator/semiconductor interface are complemented by in situ analyses such as reflection high electron energy diffraction, scanning tunneling microscopy, and x-ray photoelectron spectroscopy as well as ex situ spectroscopic ellipsometry and high …

    uiuc Repository record for Deposition and Characterization of Silicon Nitride/gallium Arsenide Metal Insulator Semiconductor Structures With Heteroepitaxial Interlayers (opens in a new tab)

  9. A metal-insulator-semiconductor study of the bulk and surface properties of Hg₁₋ Cd Te.

    Thesis. 1977. M.S.--Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.

    mit Repository record for A metal-insulator-semiconductor study of the bulk and surface properties of Hg₁₋ Cd Te. (opens in a new tab)

  10. Stability Investigation of Silicon Nanowire Solar Cells

    … cells' nanowire active layer used here. The metal insulator semiconductor structure in which the semiconductor is made of Silicon nanostructures is used in this work to study and investigate the Silicon nanostructure's stability. The back contact and oxidation layer optimisation process have …

    de-montfort Repository record for Stability Investigation of Silicon Nanowire Solar Cells (opens in a new tab)

  11. Preparation and characterization of in situ deposited metal-insulator-III-V semiconductor devices

    … and characterization of in-situ deposited III-V semiconductor-based Metal-Insulator-Semiconductor (MIS) devices are described. The two III-V semiconductors investigated were $\rm In\sb{0.53}Ga\sb{0.47}As$ and GaAs. The problems related to air exposure of the semiconductor surface in ex-situ …

    uiuc Repository record for Preparation and characterization of in situ deposited metal-insulator-III-V semiconductor devices (opens in a new tab)

  12. Power Electronics Based on Ultrawide Bandgap Semiconductors: from Material Engineering to Device Applications

    … work demonstrates high-performance BN/β-Ga2O3 metal-insulator-semiconductor Schottky barrier diodes (MIS SBDs). The BN layer is directly grown on the β-Ga2O3 by pulsed laser deposition (PLD). The presence of a ~2.8 nm BN layer is confirmed by a series of techniques, including X-ray …

    rice Repository record for Power Electronics Based on Ultrawide Bandgap Semiconductors: from Material Engineering to Device Applications (opens in a new tab)

  13. Design and fabrication of field-effect III-V Schottky junction solar cells

    … shown and proved. Schottky solar cells based on metal-(insulator)-semiconductor (M-I-S) structure have been designed and fabricated using various wide bandgap semiconductors, such as GaAs and Al<sub>0.3</sub>Ga<sub>0.7</sub>As. A secondary bias layer has been introduced to the device structure, …

    must-thes Repository record for Design and fabrication of field-effect III-V Schottky junction solar cells (opens in a new tab)

  14. Tunneling spectroscopy in p-type silicon

    Tunneling in boron doped p-type silicon metal-semiconductor and metal-insulator-semiconductor tunnel junctions has been studied at low temperatures by measuring the derivatives, di/dV and d2i/dV2, of the current-voltage characteristics as functions of applied bias voltage V. The junctions were …

    uiuc Repository record for Tunneling spectroscopy in p-type silicon (opens in a new tab)

  15. Electrical properties of various single-wall carbon nanotube networks

    … of cut-SWCNT LbL networks integrated into metal- insulator-semiconductor devices are discussed in view of organic memory device applications.

    durham Repository record for Electrical properties of various single-wall carbon nanotube networks (opens in a new tab)

  16. Atomic layer deposition Al2O3-passivated AlGaN/GaN high-electron-mobility transistors on Si(111) towards reliable high-speed electronics

    … resistance of 4 × 10-6 Ω–cm2 with Ti/Al/Ni/Au metal stacks has been achieved by three-step rapid thermal annealing. Furthermore, it is revealed that annealed, thin-Al2O3 dielectric is an effective (Al)GaN surface passivation alternative for minimizing passivation-associated parasitic …

    uiuc Repository record for Atomic layer deposition Al2O3-passivated AlGaN/GaN high-electron-mobility transistors on Si(111) towards reliable high-speed electronics (opens in a new tab)

  17. Research and development of CdS/CdTe solar cells incorporating ZnTe layers.

    … known as 'two-sixers' from periodic table. The semiconductors are cadmium sulfide (CdS), cadmium telluride (CdTe) and zinc telluride (ZnTe).All of these layers were obtained by growing them using electrodeposition in aqueous solutions. In this project, electrodeposition using 2-electrode system …

    sheffield-hallam Repository record for Research and development of CdS/CdTe solar cells incorporating ZnTe layers. (opens in a new tab)

  18. Nanoparticle-based Organic Energy Storage with Harvesting Systems

    … The storage devices are made out of an organic semiconductor material and charge storage elements from synthesized nanoparticles. The semiconducting polymer is obtained by blending poly (vinyl alcohol) and poly (acrylic acid) in crystal state polymers with a known plasticizer; glycerol or …

    vt Repository record for Nanoparticle-based Organic Energy Storage with Harvesting Systems (opens in a new tab)

  19. The Effect of Morphology on Carrier Dynamics in Solution Processed Solar Cells

    … via Linearly Increasing Voltage (photo-CELIV), Metal Insulator Semiconductor-CELIV (MIS-CELIV), and Resistance Photovoltage (RPV) are detailed.</p> <p>The photo-CEILV technique is used to probe P3HT devices of varying molecular weights. This material is known to have a microstructure which …

    denver Repository record for The Effect of Morphology on Carrier Dynamics in Solution Processed Solar Cells (opens in a new tab)

  20. Dynamic ON-resistance in high voltage GaN field-effect-transistors

    … Secondly, high-voltage GaN-on-Si MIS (Metal-Insulator-Semiconductor) HEMTs designed for > 600 V switching operation have been investigated. Excessive electron trapping leading to total current collapse has been observed. We have carried out an extensive characterization of this …

    mit Repository record for Dynamic ON-resistance in high voltage GaN field-effect-transistors (opens in a new tab)

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