Global ETD Search

Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.

Results

Showing 1 to 4 of 4 for “"memory reliability"”.

  1. A novel low-temperature growth method of silicon structures and application in flash memory.

    … The increase in the density of flash memory devices over the years has come as a result of continuous memory cell-size reduction. This size scaling is however approaching a dead end and it is widely agreed that further reduction beyond the 20 nm technological node is going to be very …

    de-montfort Repository record for A novel low-temperature growth method of silicon structures and application in flash memory. (opens in a new tab)

  2. Test and diagnosis of memories embedded in Automotive SoCs

    L'abstract è presente nell'allegato / the abstract is in the attachment

    poli-torino Repository record for Test and diagnosis of memories embedded in Automotive SoCs (opens in a new tab)

  3. Reliable processing-in-memory

    Processing-in-memory (PIM) architectures integrate compute units within memory, enhancing performance and efficiency but introducing significant reliability challenges. These challenges arise from the inherent conflict between localized data accesses, which minimize data movement, and the necessity …

    texas Repository record for Reliable processing-in-memory (opens in a new tab)

  4. Adaptive reliability chipkill correct (ARCC)

    … is an advanced type of error correction in memory that is popular among servers. Large field studies of memories have shown that chipkill correct reduces uncorrectable error rate by 4X to 36X compared to the weaker Single Error Correct Double Error Detect (SECDED). Currently, there is a …

    uiuc Repository record for Adaptive reliability chipkill correct (ARCC) (opens in a new tab)