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Showing 1 to 12 of 12 for “"manufacturing test"”.

  1. Investigation into voltage and process variation-aware manufacturing test

    … complexity in IC design provides challenges for manufacturing testing. This thesis studies how process and supply voltage variation influence defect behaviour to determine the impact on manufacturing test cost and quality. The focus is on logic testing of static CMOS designs with respect to two …

    soton Repository record for Investigation into voltage and process variation-aware manufacturing test (opens in a new tab)

  2. Search State Extensibility based Learning Framework for Model Checking and Test Generation

    … resource intensive design verification and manufacturing test phases in the product life-cycle of a digital system. On the contrary, time-to-market constraints require faster verification and test phases; otherwise it may result in a buggy design or a defective product. This trend in the …

    vt Repository record for Search State Extensibility based Learning Framework for Model Checking and Test Generation (opens in a new tab)

  3. (VDL)² : a jitter measurement built-in self-test circuit for phase locked loops

    … proposed application for this circuit is during manufacturing test of the PLL. The circuit is implemented in IBM's 90 nm process and was completed in the PLL and Clocking Development ASIC group at IBM Microelectronics in Essex Junction, Vermont as part of the VI-A program.

    mit Repository record for (VDL)² : a jitter measurement built-in self-test circuit for phase locked loops (opens in a new tab)

  4. Application of Statistical Predictive Models for Field Failure and Cisco Testing Data (Big Data Source: Cisco)

    … in how field failure categories relate to manufacturing test failures to better predict the tests that should be performed on a product after a return by a customer and what tests will be failed by a product before and after a return by a customer based on what type of failure occurred in …

    calpoly Repository record for Application of Statistical Predictive Models for Field Failure and Cisco Testing Data (Big Data Source: Cisco) (opens in a new tab)

  5. Test and diagnosis of resistive bridges in multi-Vdd designs

    … raise a number of challenges for existing manufacturing test and diagnosis techniques, as certain defects exhibit Vdd dependent detectability. This means that to achieve 100% fault coverage, APM-enabled devices should be tested at all operating voltages using repetitive tests. Repetitive …

    soton Repository record for Test and diagnosis of resistive bridges in multi-Vdd designs (opens in a new tab)

  6. Achieving Six Sigma printed circuit board yields by improving incoming component quality and using a PCBA prioritization algorithm

    … in product and component technologies, manufacturing tests are being pushed to the limits as consumers are demanding higher quality and more reliable electronics than ever before. Cisco Systems, Inc. (Cisco) currently manufactures over one thousand different types of printed circuit …

    mit Repository record for Achieving Six Sigma printed circuit board yields by improving incoming component quality and using a PCBA prioritization algorithm (opens in a new tab)

  7. A predictive troubleshooting model for early engagement

    … businesses. Circuit Card Assembly includes manufacturing, test, quality, finance and other groups, functioning as its own business within Raytheon IDS. Circuit Card Assembly competes with external vendors for contracts from Raytheon businesses outside of IDS, thus the pursuit of competitive …

    mit Repository record for A predictive troubleshooting model for early engagement (opens in a new tab)

  8. Efficient Graph Techniques for Partial Scan Pattern Debug and Bounded Model Checkers

    … to these developments, design verification and manufacturing test have gained more importance and 70 % of the design expenditure in on validation processes. Electronic Design Automation (EDA) tools play a huge role in the validation process with various verification and test tools. Their …

    vt Repository record for Efficient Graph Techniques for Partial Scan Pattern Debug and Bounded Model Checkers (opens in a new tab)

  9. Predicting performance parameters of analog and mixed-signal circuits using built-in and built-off self test

    … been increasingly important in cost-effective manufacturing test for mixed-signal devices. A typical SoP encapsulates many of its internal functions, and its production test is performed by application of test signals to the SoP under control of external Automatic Test Equipment (ATE). However …

    texas Repository record for Predicting performance parameters of analog and mixed-signal circuits using built-in and built-off self test (opens in a new tab)

  10. Exploratory Study on the Design of Combined Aero-Thermo-Structural Experiments in High Speed Flows

    … and responses of panels for experimental tests investigating fluid-thermal-structural interactions. The United States Department of Defense (DoD) and the National Aeronautics and Space Administration (NASA) are both interested in hypersonic vehicles due to their incredible capabilities for …

    ohiolink Repository record for Exploratory Study on the Design of Combined Aero-Thermo-Structural Experiments in High Speed Flows (opens in a new tab)

  11. Perichromism: a novel technique to distinguish between amorphous and crystalline material

    … amorphous or crystalline nature of each sample tested by DRUV spectroscopy was independently verified by the following techniques: FT-Raman spectroscopy; differential scanning calorimetry; and X-ray diffraction. These techniques were also used to compare the excipient without the probe to that …

    greenwich Repository record for Perichromism: a novel technique to distinguish between amorphous and crystalline material (opens in a new tab)

  12. System-Level Test techniques for Automotive SoCs

    L'abstract è presente nell'allegato / the abstract is in the attachment

    poli-torino Repository record for System-Level Test techniques for Automotive SoCs (opens in a new tab)