Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 20 of 33 for “"life testing"”.
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Accelerated life testing : concepts and models
… thesis deals with the analysis of accelerated life test. First, we provide related concepts and second, we provide detailed properties of three alternative distributions, Gamma, Log-normal and Inverse Gaussian. Various models for failure times are considered which are plausible in this context …
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A study of some life testing distributions
… articles. The first article considers a new life-testing distribution which has the property of possessing a failure rate function which can be U-shaped or exponentially increasing depending on the value of the shape parameter. In addition, this article considers generalized least squares …
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Bootstrap-based confidence intervals in partially accelerated life testing
"Accelerated life testing (ALT) is utilized to estimate the underlying failure distribution and related parameters of interest in situations where the components under study are designed for long life and therefore will not yield failure data within a reasonable test period. In ALT, life testing is …
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Bringing Unheard Orchestral Works to Life: testing the digital orchestra
… The most important element of research is the testing of orchestral sound libraries in bringing to life forgotten or neglected orchestral music that deserves recognition. This is especially relevant at a time when concert and operatic repertoire is shrinking due to the increased costs of …
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Modeling And Characterizations Of New Notions In Life Testing With Statistical Applications
Knowing the class to which a life distribution belongs gives us an idea about the aging of the device or system the life distribution represents, and enables us to compare the aging properties of different systems. This research intends to establish several new nonparametric classes of life …
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Design of an electro-mechanical hexapod for accelerated life testing of optical fiber assemblies
… Focal Ratio Degradation (FRD) [3]. Therefore, a life cycle test must be conducted to study fiber behavior and measure FRD as a function of time. This thesis describes the design and design methodology of an electro-mechanical test apparatus for accelerated life testing of optical fiber …
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Optimal and Robust Designs of Step-stress Accelerated Life Testing Experiments for Proportional Hazards Models
Accelerated life testing (ALT) is widely used to obtain reliability information about a product within a limited time frame. The Cox s proportional hazards (PH) model is often utilized for reliability prediction. My master thesis research focuses on designing accelerated life testing experiments …
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Bayes and minimum variance unbiased estimators of reliability using the truncated Weibull life testing model
… the scale parameter θ in the truncated Weibull life testing model when the shape parameter ρ assumed known. In addition, we shall estimate the corresponding reliability function of the above estimators. The first type of estimator of θ and the reliability function we will consider is the Bayes …
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Comparison of Bayes' and minimum variance unbiased estimators of reliability in the extreme value life testing model
… using the extreme value distribution as the life-testing model. First the unbiased minimum variance estimator is derived. Then the Bayes' estimators for the uniform, exponential, and inverted gamma prior distributions are obtained, and these results are extended to a whole class of …
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Standard operating procedure for Highly Accelerated Life Testing (HALT) : design and standardization of fixture setup for circuit boards
… with the introduction of Highly Accelerated Life Testing (HALT) in a multinational corporation as part of a reliability improvement process for printed circuit boards (PCBs). More specifically, the thesis focuses on drafting a standard operating procedure (SOP) to standardize the fixture …
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Scale-up of a high-technology manufacturing startup : improving product reliability through systematic failure analysis and accelerated life testing
… design process and to establish a framework for testing and analyzing product life so that imperative business decisions and design improvements could be made with regards to reliability. A detailed study and implementation of these process improvements to address reliability issues was conducted …
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Creation, validation, and implementation of a Highly Accelerated Life Testing (HALT) procedure to improve the reliability of printed circuit boards
Highly Accelerated Life Testing (HALT) is a test methodology to evaluate the reliability of electronic and electromechanical devices. This thesis aimed at the implementation of Highly Accelerated Life Testing (HALT) on Printed Circuit Boards. A standard operating procedure for implementing Highly …
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ACCELLERATED SELF-LIFE TESTING OF COFFEE: THE ROLE OF INNOVATIVE FLEXIBLE PACKAGING MATERIALS ON OXIDATION AND SHELF-LIFE ESTIMATION WITH A SIGHT ON THEIR ENVIRONMENTAL SUSTAINABILITY.
… to a decline in aroma, flavour, and shelf life. The development of effective, sustainable, and high-performance packaging solutions requires a multidisciplinary approach that combines material science, analytical techniques, sensory evaluation, and environmental sustainability. This …
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Internal resistance variances in lithium-ion batteries and implications in manufacturing
… IR as a function of cycling, models the cycle life of a simple battery pack of two parallel-connected cells that start off as unbalanced, and validates it with experimental data from cycle life testing of parallel-connected LiFePO₄ cell groups. Experimental results from samples of commercially …
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Developing Highly Accelerated Life Test (HALT) method to improve product robustness and shorten development cycle
Highly Accelerated Life Testing (HALT) is often used to identify the latent defects for the printed circuit boards (PCBs) during the early stage of the product development process. The inconsistency in executing HALT may not reveal the maximum amount of design weaknesses or intermittent failures, …
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Thermal Characterization of Die-Attach Degradation in the Power MOSFET
… MOSFET module is subject to change over its lifetime. This is caused by the growth of voids and other defects in the die-attach layer. The goal of this dissertation is to develop measurement techniques and finite element simulations that can measure the changes in thermal performance caused …
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Verification of rain-flow reconstructions of a variable amplitude load history
… original loading spectrum for component fatigue life testing is investigated. A modified helicopter maneuver history is used for the rain-flow cycle counting and history regenerations. Experimental testing on a notched test specimen over a wide range of loads produces similar lives for the …
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