Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 20 of 27 for “"kelvin probe force microscopy"”.
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Kelvin Probe Force Microscopy on Graphene Thin Films for Solar Cell and Biosensing Applications
… of open circuit voltage was investigated using Kelvin Probe Force Microscopy (KPFM) in the dark and under light irradiation. In our study, we have also demonstrated the fabrication of photovoltaic devices from cost-effective, water-soluble, and bio-sensitive acridine orange molecules. We …
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Probing charge motion in next-generation semiconductors with scanned probe microscopy
Scanned probe microscopy has allowed researchers to explore spatial variations in charge generation and transport in solar-cell films prepared on a conductive substrate with a best-case resolution of 2 nanometers. In this thesis, we introduce new scanned probe measurements to measure light- and …
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Laser direct written silicon nanowires for electronic and sensing applications
… between dopant levels are measured using Kelvin probe force microscopy.</p>
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Two-Dimensional Titanium Carbide MXene for Lithium-ion Conductive Solid-state Electrolytes
… using X-ray diffraction (XRD), scanning electron microscopy with energy-dispersive spectroscopy (SEM-EDS), Fourier-transform infrared (FTIR) spectroscopy, atomic force microscopy (AFM), and Kelvin probe force microscopy (KPFM) to evaluate its structural and morphological properties. To explore the …
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Probing complex ionic dynamics on the nanoscale via energy discovery platforms
… lateral devices that enable multiple in-situ microscopy, spectroscopy, and functional characterization techniques to be performed on a single set-up. They provide easy control of external conditions including temperature (25 °C – 200 °C), humidity (0% – 90% at 25 °C), ambient gas (air and …
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Charged ferroelectric domain walls: the next generation in 2D functional materials
… niobate. <br/><br/>Through the use of atomic force microscopy (AFM), electron microscopy and electrical measurements I measured Hall mobility in these systems. This revealed that carriers in domain walls are significantly more mobile than charge carriers measured in bulk ferroelectrics. In the …
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Scanning probe microscopy study of thin film solar cells
… solar cells have been studied by using scanning probe microscopy based techniques. The scanning spreading resistance microscopy (SSRM) has been developed on the cross-section of CdTe solar cells to study the resistance and carrier concentration distribution in different layers of the device. The …
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Putting the Needle to the Haystack: Submolecular Structure Elucidation with Atomic Force Microscopy in Ultra High Vacuum
Atomic Force Microscopy and related methods like Kelvin Probe Force Microscopy and Scanning Tunneling Microscopy are valuable assets to investigate structures and sample morphologies beyond the capabilities of optical microscopic methods. Over the course of this work, these shall be employed to …
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Electrostatic effects of inhomogeneous strain in monolayer transition metal dichalcogenides
… strained via a nanopatterned substrate. Kelvin probe force microscopy and electrostatic gating are used to measure the spatial distribution of the conduction band edge energy which can be correlated to in-plane hydrostatic strain. This method demonstrates the capability to resolve the …
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Hall Potential Mapping of Conducting Ferroelectric Domain Walls
… thesis details the development of a scanning probe microscopy technique that facilitates spatial mapping of the Hall effect within conducting domain walls. The measurements presented herein represent the first explicit characterisation of the carriers involved in conducting ferroelectric …
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Controlled growth and doping of core-shell GaAs-based nanowires
… was maintained. A variety of analytical electron microscopy techniques confirmed the shell deposition to be uniform, epitaxial, defect-free, and nearly atomic sharp. These results demonstrate that core-shell nanowires possess a core-shell interface free of many of the imperfections that …
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Advanced Synthesis of Ultra-High Temperature Ceramics (UHTCs) and High Temperature Electron Emitting Materials
… UHS sintering. W_f measurements were obtained by Kelvin probe force microscopy. Ba-substitution was found to lower W_f (~25%) in synthesized multicomponent hexaborides. The specific techniques required to engineer the W_f of these materials are also provided herein. Finally, combining low W_f …
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THE ROLE OF NATIVE POINT DEFECTS AND SURFACE CHEMICAL REACTIONS IN THE FORMATION OF SCHOTTKY BARRIERS AND HIGH N-TYPE DOPING IN ZINC OXIDE
… cathodoluminescence spectroscopy (DRCLS), atomic force microscopy (AFM), Kelvin probe force microscopy (KPFM), and surface photovoltage spectroscopy (SPS) to show that surface treatment and processing plays a significant role in the quality, stability, and efficiency of potential next generation …
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Nanostructured BaTiO3 Thin Films for Enhanced Photoresponse
… synthesized. The transmission electron microscopy revealed a homogeneous structure, which has not been reported in perovskite/spinel material systems. Ferroelectricity was retained in a low-CFO-ratio composite, enabling polarization-dependent photocurrent under visible light. Utilizing …
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Electro-mechanically interfacing with biology using piezoelectric polymer nanostructures
… X-ray Diffraction (XRD) and Piezo-response Force Microscopy (PFM) combined with Finite Element Analysis (FEA). The results indicated that the nanowires were highly crystalline (up to 45 %) with a degree of molecular alignment, and that the nanowires displayed shear piezoelectricity with an …
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PU elastomers and grafted GO/PU nanocomposite with self-healing and self-adapting capabilities for next-generation electrical insulation
… respectively, which are the main driving forces to achieve the self-healing function. 2D optical micrographs, 3D computed micro-X-ray tomography, and cross-sectional SEM images all confirmed that the micro dendritic defects in the designed PU are completely healed under moderate thermal …
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Nanoscale electrical characterisation of nitride structures
… to device performances. Electrical scanning probe microscopy techniques, including scanning capacitance microscopy (SCM), conductive atomic force microscopy (C-AFM) and kelvin probe force microscopy (KPFM), were utilized to study the structures of nitride devices such as high electron …
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Nano-engineering of Atomically Thin Novel 2D Materials and Their Heterostructures
… (Cr2Ge2Te6; CGT) are explored through magnetic force microscopy (MFM) mapping to precisely image the magnetic phases. large strain percentage is found to vehemently improves the Tc from cryogenic temperatures to room temperature, which is the first experimental demonstration of strain induced …
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