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Showing 1 to 1 of 1 for “"high resolution soft x-ray absroption near edge structure (XANES)"”.

  1. Soft x-ray near edge spectroscopy of cuprous oxide and silicon-germanium alloys

    High resolution soft x-ray absorption near edge structure (XANES) spectra have been obtained for CU20 and for SiGe1-x semiconductor alloys, xas a function of composition x, using the methods of partial electron yield and thin film absorption. The shapes of the near edge features provide a unique …

    uiuc Repository record for Soft x-ray near edge spectroscopy of cuprous oxide and silicon-germanium alloys (opens in a new tab)