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Showing 1 to 1 of 1 for “"high resolution monochromator"”.
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Determination of grain-level strain and proposing a new method of strain determination for three dimensional x-ray diffraction (3DXRD)
… strain from near-field data (near-field has less resolution in 2$\theta$. $\theta$ is the scattering angle for diffraction). The method is developed using the far-field 3DXRD data obtained from an \textit{in-situ} experiment of a Ti-7Al alloy sample. The experiment is conducted at beamline- 1 ID …