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Showing 1 to 1 of 1 for “"high flux focused ion beam (FIB)"”.
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Mechanisms of focused ion beam (FIB) material removal and rearrangement at high beam flux
Focused ion beam (FIB) is widely used as a material removal tool for applications ranging from electron microscope sample preparation to nanopore processing for DNA sequencing. Despite the wide spread use of FIB, the basic material removal mechanisms are not well understood and may depend upon FIB …