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Showing 1 to 1 of 1 for “"field-induced CDM (FICDM)"”.
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Charged device model electrostatic discharge protection and test methods for integrated circuits
… this work focuses on charged device model (CDM) protection and test methods. In this work it is shown that the CDM robustness of an I/O can be increased by proper biasing of the gates during an ESD event. These gate bias networks are particularly useful because they do not add capacitance to …