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Showing 1 to 5 of 5 for “"electrostatic force microscopy"”.

  1. Nonlinear Polymer Nanocomposite for Field Grading in Medium-Voltage Power Converters under High-Altitude and Humid Environments

    … was applied as a conformal field-grading layer. Electrostatic force microscopy (EFM) measurements exhibit an average distance of 135 nm between nanoparticles within the polymer matrix. Finite element simulations conducted in COMSOL demonstrated that the nonlinear conductivity of the PNC …

    vt Repository record for Nonlinear Polymer Nanocomposite for Field Grading in Medium-Voltage Power Converters under High-Altitude and Humid Environments (opens in a new tab)

  2. Nanomechanical and nanoelectromechanical phenomena in 2D-atomic crystals : a scanning probe microscopy approach

    … use scanning probe techniques of ultrasonic force microscopy (UFM), direct-contact electrostatic force microscopy (DC-EFM) and heterodyne force microscopy (HFM). With the use of these techniques we report the observation of the nanoscale Moir`e pattern when graphene is aligned on h-BN and we …

    lancaster Repository record for Nanomechanical and nanoelectromechanical phenomena in 2D-atomic crystals : a scanning probe microscopy approach (opens in a new tab)

  3. Synthesis and Characterization of CdSe/ZnS Core/Shell Quantum Dot Sensitized PCPDTBT-P3HT:PCBM Organic Photovoltaics

    … characterization was conducted with atomic force microscopy and electrostatic force microscopy. When compared to the control, the sensitized devices exhibited increased absorption and depressed electrical performance with increasing quantum dot loading. The surface morphology, both …

    calpoly Repository record for Synthesis and Characterization of CdSe/ZnS Core/Shell Quantum Dot Sensitized PCPDTBT-P3HT:PCBM Organic Photovoltaics (opens in a new tab)

  4. Non-destructive Electrical Characterization of Controlled Waspaloy Microstructures

    … X-ray Scattering (USAXS), Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD) to gain a complete understanding of the microstructural transformations and the associated mechanisms. Three different sets of controlled microstructures were produced in this research. In Set I …

    gatech Repository record for Non-destructive Electrical Characterization of Controlled Waspaloy Microstructures (opens in a new tab)

  5. Switching mechanisms, electrical characterisation and fabrication of nanoparticle based non-volatile polymer memory devices.

    … polymer layer. Gold nanoparticle charging via electrostatic force microscopy (EFM) was demonstrated, using a novel device structure involving depositing gold nanoparticles between lateral electrodes. This allowed the gold nanoparticles themselves to be imaged, rather than the nanoparticle …

    de-montfort Repository record for Switching mechanisms, electrical characterisation and fabrication of nanoparticle based non-volatile polymer memory devices. (opens in a new tab)