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Showing 1 to 6 of 6 for “"electroreflectance"”.

  1. Electroreflectance of silicon

    Submitted by William Weathers (weathrs2@illinois.edu) on 2012-04-12T21:49:32Z No. of bitstreams: 1 1973_grover.pdf: 2607668 bytes, checksum: cd6ed81744c48c6e0917a30086d90b44 (MD5)

    uiuc Repository record for Electroreflectance of silicon (opens in a new tab)

  2. Electroreflectance of germanium

    … region .7 eV to 5 eV was investigated using the electroreflectance (ER) technique. Several transitions were detected in this energy range and in almost all cases, the associated critical points were identified as to their type and origin in k-space. At the direct edge (r~ r7 transitions at .79 …

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  3. Electroreflectance of gallium arsenide

    "The electroreflectance spectrum of n-type gallium arsenide in the 1.2 - 5.3 eV photon energy range has been measured. The 6e l and 6e2 l1neshapes of six different critical points were analyzed in detail by fitting the one-electron Frapz-Keldysh-Aspnes theory to each separate critical point …

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  4. Determination of the Band Gap Bowing Parameter of A1xGa1-xN with Contactless Electroreflectance

    Contactless electroreflectance (CER), a modulation spectroscopy (MS) technique, has been used to study the A and C exciton transitions in A1xGa1-xN layers for a composition range of 0 ≤ x ≤ 0.48 at room temperature. Taking the entire composition range (0 ≤ x ≤ 1) into account by incorporating a …

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  5. OPTICAL CHARACTERIZATION OF WIDE ENERGY AGP GROUP III-NITRIDE SEMICONDUCTORS

    … findings. Photoreflectance (PR) and contactless electroreflectance (CER) were employed to study the undoped GaN, n-type GaN, Au-Schottky contacts on GaN, and piezoelectric effects in AIGaN/InGaN/GaN heterostructures. With the assistance of the PV spectra, we found that both the free exciton …

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