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Showing 1 to 2 of 2 for “"double crystal x-ray diffraction"”.
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Growth and Characterization of Carbon-Doped Aluminum(x) Gallium(1-X) Arsenide and Aluminum(x) Gallium(1-X) Phosphide
… secondary ion mass spectrometry (SIMS), double crystal x-ray diffraction and nuclear reaction analysis in an ion channeling geometry. It was revealed that the surface morphology and elemental composition of p$\sp+$ Al$\sb{\rm x}$Ga$\sb{\rm 1-x}$As were critically dependent on the growth …
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Liquid phase epitaxial growth and heterointerface characteristics of long-wavelength indium gallium arsenide phosphide heterostructures
… growth conditions, exhibit considerably narrower diffraction profile half-widths than previously reported. The double crystal x-ray diffraction half-width is a relatively new assay of crystalline alloy compositional homogeneity, and the 13 arc sec value presented here for InGaAsP may represent a …