Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 7 of 7 for “"depth profile analysis"”.
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Research and development of CuInSe[2]-based photovoltaic solar cells.
… was studied by SEM and AFM. The elemental bulk analysis was performed using XRF and ICPMS. The elemental surface analysis was performed using XPS and the depth profile analysis was studied by GDOES. The optical properties were characterised by optical absorption and the conductivity type was …
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In situ and post mortem surface chemistry measurements of boronization in the national spherical torus experiment upgrade
… it from contaminating the plasma. The Materials Analysis and Particle Probe (MAPP) is an in situ materials characterization facility installed on NSTX-U and used during the 2015-2016 experimental campaign. MAPP is designed as a PFC diagnostic and can expose and analyze samples on a shot-to-shot …
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Untersuchungen zu Schichtwachstum und Grenzflächen an Ta-basierten Dünnschichten mittels XPS
In der vorliegenden Arbeit wird das Wachstum von Ta- und TaN-Schichten auf Si- und SiO_2-Substraten untersucht Die Schichten werden dabei unter technologienahen Bedingungen mittels Magnetron-Sputtern abgeschieden. Die Untersuchungen erfolgen hauptsächlich mit winkelaufgelöster …
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Bonding mechanisms in the application of thermal barrier coatings to turbine blades.
… atomic emission technique used for both bulk and depth profile analysis, which had not previously been applied to TBC's, and SEM and TEM in order to enhance understanding of failure modes in TBC systems and adhesion process. The results obtained from the studies indicate that the GDOES technique …
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Novel analytical method for investigating compositional driven ion-induced nanopatterning of multicomponent materials
… of the surface composition as a function of depth. This model is based on potential mechanisms involved, including preferential sputtering and segregation, and is formulated in the framework of ARAES analysis, allowing for the ARAES data to be fit directly in a phenomenological approach to …
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Chemical vapor deposition of thin film materials for electronic and magnetic applications
… of surface chemical composition. In vacuo XPS depth profile analysis showed the existence of hafnium carbide phase, which to a certain degree can improve the film conductivity. Direct liquid injection chemical vapor deposition (DLI-CVD) has been utilized for epitaxial growth of nickel ferrite …
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STUDY OF STRUCTURAL, THERMAL, HYDROGENATION AND COMPOSITIONAL PROPERTIES OF NI-BASED AMORPHOUS MEMBRANES USING EXPERIMENTAL AND COMPUTATIONAL METHODS
… of Lawrence Berkeley National Laboratory. Depth profile analysis using the X-ray photoelectron spectroscopy (XPS) gave an insight in to the difference in the surface composition of both the sides of membranes and the effect alloy composition on the same. Addition of alloying elements such …