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Showing 1 to 20 of 2301 for “"defect"”.

  1. Zero defect data

    Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1991.

    mit Repository record for Zero defect data (opens in a new tab)

  2. Point defect engineering in germanium

    … to silicon, little is known about the point defects in germanium. The goal of the present doctoral work is to remedy this gap. To this end, we have used radiation (gamma rays, alpha particles, and neutrons) to controllably introduce point defects in crystalline germanium, which were then …

    mit Repository record for Point defect engineering in germanium (opens in a new tab)

  3. Thermography Approaches for Building Defect Detection

    … can be used to detect thermally significant defects in buildings and is traditionally performed using a walk-through methodology. Yet because of limitations such as transient climatic changes, there is a key performance gap between image capture and interpretation. There are however new …

    plymouth Repository record for Thermography Approaches for Building Defect Detection (opens in a new tab)

  4. Defect correction methods for computational aeroacoustics

    The idea of Defect Correction Method (DCM) has been around for a long time. It can be used in a number of different ways and can be applied to solve various linear and non-linear problems. Most defect correction related methods were used in conjunction with discretisation methods and two-level …

    greenwich Repository record for Defect correction methods for computational aeroacoustics (opens in a new tab)

  5. Defect Detection in Selective Laser Melting

    … using selective laser melting (SLM) are prone to defects created during the build process due to part shrinkage while cooling. Currently defects are found only after the part is removed from the printer. To determine whether cracks can be detected before a print is completed, this project …

    calpoly Repository record for Defect Detection in Selective Laser Melting (opens in a new tab)

  6. Defect Engineering for Controlling Semiconductor Diffusion

    Bulk point defects such as vacancies and interstitial atoms govern many aspects of the behavior of crystalline solids, especially for semiconductors. Essentially no literature has focused upon bulk point defects as the mediators of the physics of surface-bulk coupling, however. We have discovered …

    uiuc Repository record for Defect Engineering for Controlling Semiconductor Diffusion (opens in a new tab)

  7. Defect engineering of metal oxide semiconductors

    Defects in semiconductors have been studied for many years, with a view toward controlling their behavior through various forms of defect engineering. In the Si-based microelectronics industry, numerous methods to characterize and control the behavior of defects have been developed, including novel …

    uiuc Repository record for Defect engineering of metal oxide semiconductors (opens in a new tab)

  8. Adjoint-based particle defect yield modeling

    … of the process variation impact of particle defects. Such particle defects can arise in photolithography, deposition, etch, and other processes, and can perturb the intended function of photonic devices and circuits. The adjoint method previously used in optimization is modified and …

    mit Repository record for Adjoint-based particle defect yield modeling (opens in a new tab)

  9. Non-contact defect detection in silicon

    Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1984.

    mit Repository record for Non-contact defect detection in silicon (opens in a new tab)

  10. Software defect localization using explainable deep learning

    … of discovery models, or their ability to detect defects that span multiple modules or analyze code interprocedurally, also influences their detection capabilities. In the scope of this thesis, we explore and tackle the challenges associated with machine learning-based vulnerability discovery …

    tu-berlin Repository record for Software defect localization using explainable deep learning (opens in a new tab)

  11. Research on Print Defect Visibility and Evaluation

    … this paper, we propose a Masking Mediated Print Defect Visibility Predictor (MMPDVP) to predict the visibility of defects in the presence of customer content. The parameters of the algorithm are trained from ground-truth images that have been marked by subjects. The MMPDVP could help the press …

    purdue-thes Repository record for Research on Print Defect Visibility and Evaluation (opens in a new tab)

  12. Non-integrated Defect Relations for General Divisors

    … my dissertation, I establish two non-integrated defect relations. The first applies to meromorphic maps from a Kahler manifold, whose universal covering is a ball, into a projective variety that intersects general divisors properly. This is achieved by incorporating the beta constants into the …

    houston Repository record for Non-integrated Defect Relations for General Divisors (opens in a new tab)

  13. Advanced Methods for Defect Engineering in Silicon

    … to study the effects of two newly discovered defect engineering mechanisms: the use of surface chemistry and optical stimulation on boron diffusion and activation during thermal annealing for ultrashallow junction formation. The work has a strong focus on the use of mathematical modeling to …

    uiuc Repository record for Advanced Methods for Defect Engineering in Silicon (opens in a new tab)

  14. Defect reactions and impurity control in silicon

    … thesis has covered the scientific issues of defect reactions involving dopants and impurities in Si, and the applications of this knowledge to reactive ion etching (RIE) and Fe gettering processes. The reactions among self-interstitials (Sii), vacancies (V), impurities (C, 0), and dopants (B, …

    mit Repository record for Defect reactions and impurity control in silicon (opens in a new tab)

  15. Generalized quantum defect methods in quantum chemistry

    The reaction matrix of multichannel quantum defect theory, K, gives a complete picture of the electronic structure and the electron - nuclear dynamics for a molecule. The reaction matrix can be used to examine both bound states and free electron scattering properties of molecular systems, which are …

    mit Repository record for Generalized quantum defect methods in quantum chemistry (opens in a new tab)

  16. Wafer defect prediction with statistical machine learning

    … important to drive cost savings by screening out defective die upstream. The primary goal of the project is to build a statistical prediction model to facilitate operational improvements across two global manufacturing locations. The scope of the project includes one high-volume product line, an …

    mit Repository record for Wafer defect prediction with statistical machine learning (opens in a new tab)

  17. Orthogonal Security Defect Classification for Secure Software Development

    Security defects or vulnerabilities are inescapable in software development. Thus, it is always better to address security issues during the software development phases, rather than developing patches after the security threats are already in place. In line with this, a number of secure software …

    queens Repository record for Orthogonal Security Defect Classification for Secure Software Development (opens in a new tab)

  18. ATM Deficiency -- A Multifaceted Defect in Lymphocyte Development

    … by ATM in response to Rag DNA DSBs and how defects in these pathways would impair lymphocyte development and contribute to the phenotype of ATM-deficient mice and humans. First, ATM-deficient lymphocytes have a defect in the repair of Rag DNA DSBs characterized by an accumulation of …

    wustl Repository record for ATM Deficiency -- A Multifaceted Defect in Lymphocyte Development (opens in a new tab)

  19. A Multiple Sensors Approach to Wood Defect Detection

    … it takes more time to remove the additional defects that occur in the lower grade material. Simultaneously, labor costs have gone up and availability of skilled workers capable of getting a high yield of usable parts has markedly decreased. To face this increasingly complex and competitive …

    vt Repository record for A Multiple Sensors Approach to Wood Defect Detection (opens in a new tab)

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