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Showing 1 to 2 of 2 for “"data volume reduction"”.
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Design for Testability Techniques to Optimize VLSI Test Cost
High test data volume and long test application time are two major concerns for testing scan based circuits. The Illinois Scan (ILS) architecture has been shown to be effective in addressing both these issues. The ILS achieves a high degree of test data compression thereby reducing both the test …
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Data mining and graph theory focused solutions to Smart Grid challenges
… Smart Grids. Demonstrating the effectiveness of data mining and graph theory in solving some of these problems is the motivation of this dissertation. One of the key challenges in taking advantage of what the Smart Grid offers is to extract information from volumes of power system data …