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Showing 1 to 5 of 5 for “"contact-resonance atomic force microscopy"”.

  1. Investigation of a contact resonance atomic force microscopy scan speed phenomenon

    … phenomena that have been observed via atomic force microscopy (AFM) experiments. Understanding the cause of these phenomena is important to perform more accurate quantitative imaging using contact-resonance AFM and other contact-mode AFM techniques at higher scan speeds. This thesis …

    unr Repository record for Investigation of a contact resonance atomic force microscopy scan speed phenomenon (opens in a new tab)

  2. Contact Resonance Atomic Force Microscopy using advanced sensors and post-processing techniques

    Micro-sensors are used within the Atomic Force Microscope for topographic and sampleproperty measurements and can achieve a nano-scale resolution. Contact resonance spectroscopy allows the estimation of mechanical properties by measuring the sensor-sample coupled system resonance frequency. To …

    unr Repository record for Contact Resonance Atomic Force Microscopy using advanced sensors and post-processing techniques (opens in a new tab)

  3. Quantitative viscoelastic spectroscopy of polymer films using Lorentz force actuated contact resonance atomic force microscopy

    Embargo set by: Seth Robbins for item 50524 Lift date: 2016-09-16T17:13:01Z Reason: Author requested closed access (OA after 2yrs) in Vireo ETD system

    uiuc Repository record for Quantitative viscoelastic spectroscopy of polymer films using Lorentz force actuated contact resonance atomic force microscopy (opens in a new tab)

  4. Design, modeling and fabrication of contact stiffness calibration samples for CR-AFM

    … a method to experimentally calibrate the contact stiffness of an atomic force microscope (AFM) cantilever tip in contact with a surface, which is a critical step in the measurement of nano-mechanical properties. The calibration exploits the relationship between contact resonance (CR) …

    uiuc Repository record for Design, modeling and fabrication of contact stiffness calibration samples for CR-AFM (opens in a new tab)

  5. Interfacial Properties of Graphene and 2D Materials Heterostructures Investigated by Scanning Probe Microscopy

    … this dissertation, advanced scanning probe microscopy (SPM) techniques, including contact resonance atomic force microscopy (CR-AFM) and piezoresponse force microscopy (PFM), are applied to study the interfacial mechanical and piezoelectrical properties of graphene and 2D materials …

    duke Repository record for Interfacial Properties of Graphene and 2D Materials Heterostructures Investigated by Scanning Probe Microscopy (opens in a new tab)