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Showing 1 to 2 of 2 for “"concurrent checking"”.

  1. Merging concurrent checking and off-line BIST

    … design for testability (DFT) problems of concurrent checking and structural off-line Built-In Self-Test. We present a new DFT method, which employs cyclic code checking as a medium to combine the concurrent checking and signature analysis in a built-in fashion. It uses bit-sliced linear …

    uvic Repository record for Merging concurrent checking and off-line BIST (opens in a new tab)

  2. Output space compaction for testing and concurrent checking

    In der Dissertation werden neue Entwurfsmethoden für Kompaktoren für die Ausgänge von digitalen Schaltungen beschrieben, die die Anzahl der zu testenden Ausgänge drastisch verkleinern und dabei die Testbarkeit der Schaltungen nur wenig oder gar nicht verschlechtern. Der erste Teil der Arbeit …

    potsdam-diss Repository record for Output space compaction for testing and concurrent checking (opens in a new tab)