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Showing 1 to 1 of 1 for “"competing wearout mechanism"”.
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Reliability and Data Analysis of Wearout Mechanisms for Circuits
… breakdown (FEOL TDDB). The separation of wearout mechanisms for circuits will be investigated, and the identification of failure modes for the failure samples will be analyzed. SRAMs and ring oscillators will be used to study the failure modes. The systematic and random errors for online …