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Showing 1 to 2 of 2 for “"cell-aware"”.

  1. Gate-Oxide-Short Defect Analysis and Fault Modeling Based on FinFET's 3D Structure

    … occur within the circuit structure. Recently, Cell-Aware Test (CAT) has been proposed to detect cell-internal defects by performing extensive analog simulations on post-layout standard circuit structures to generate the fault models. Although CAT methodology has significantly improved the …

    carleton Repository record for Gate-Oxide-Short Defect Analysis and Fault Modeling Based on FinFET's 3D Structure (opens in a new tab)