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Showing 1 to 2 of 2 for “"cell-aware"”.
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Gate-Oxide-Short Defect Analysis and Fault Modeling Based on FinFET's 3D Structure
… occur within the circuit structure. Recently, Cell-Aware Test (CAT) has been proposed to detect cell-internal defects by performing extensive analog simulations on post-layout standard circuit structures to generate the fault models. Although CAT methodology has significantly improved the …
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New techniques for quality and reliability enhancement in electronic systems
L'abstract è presente nell'allegato / the abstract is in the attachment