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Showing 1 to 1 of 1 for “"capacitively coupled TLP (CC-TLP)"”.

  1. Charged device model electrostatic discharge protection and test methods for integrated circuits

    … very-fast transmission line pulsing (VF-TLP) and capacitively coupled TLP (CC-TLP). This work presents three new wafer-level CDM testers. Two are modifications of existing CC-TLP and “WCDM” testers. The modified testers allow one to probe internal nodes during the stress event. The third, …

    uiuc Repository record for Charged device model electrostatic discharge protection and test methods for integrated circuits (opens in a new tab)