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Showing 1 to 1 of 1 for “"calorimetric test"”.
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Output Capacitance Loss Measurement and Validation for Low-Voltage Silicon and GaN Devices in DC-DC Converter Applications
… Finally, the loss data obtained from these tests are compared with each other for five different power devices to validate their applicability, and later these test results are used to get an optimized device selection criterion for the best possible efficiency and minimal losses for a ZVS …