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Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 12 of 12 for “"c-AFM"”.
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AFM and C-AFM Studies of GaN Films
… uses the techniques of atomic force microscope (AFM) and conductive AFM (C-AFM) to study the conduction properties of n-type GaN films. A total of 16 samples were examined and grouped according to their surface morphologies and conduction behaviors. The most common type of surface morpliology was …
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Characterization of electrical conductivity of carbon fiber/epoxy composites with conductive AFM and scanning microwave impedance microscopy
… carbon fibers using two Atomic Force Microscope (AFM) –based techniques: Conductive AFM (C-AFM) and Scanning Microwave Impedance Microscopy (sMIM). Unidirectional IM7/977-3 carbon fiber/epoxy laminates were manufactured and examined with these two techniques. C-AFM was used to measure the bulk …
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Atomic Force Microscope Conductivity Measurements of Single Ferritin Molecules
<p>Conductive Atomic Force Microscope (c-AFM) was used to measure the conductivity of single horse spleen ferritin (HoSF) and azotobacter vinelandii bacterial ferritin (AvBF) molecules deposited on flat gold surfaces. A 500 micron diameter gold ball was also used as a contact probe to measure the …
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Charge transport and spectroscopic analysis of high-mobility molecular semiconductors
… using conducting atomic force microscopy (C-AFM). The chapter describes C-AFM measurements conducted on single crystal films of C8-DNTT-C8 characterized by a layered morphology and a 2D character. By studying local changes in electric current on a single molecule length scale, a novel …
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Dielettrici high-κ Al-based per 4H-SiC tramite Atomic Layer Deposition
… in-situ (SE), microscopia a forza atomica (AFM) e AFM conduttiva (C-AFM), diffrazione di raggi X ad alta risoluzione (HR-XRD), microscopia elettronica a trasmissione (TEM) e TEM a scansione (STEM) accoppiata con spettroscopia a dispersione di raggi X (EDX) e spettroscopia di perdita di …
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Nanoscale electrical characterisation of nitride structures
… (SCM), conductive atomic force microscopy (C-AFM) and kelvin probe force microscopy (KPFM), were utilized to study the structures of nitride devices such as high electron mobility transistors (HEMTs), light emitting diodes (LEDs) and junction diodes. These results combine with other …
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Transmission Electron Microscopy Study of Domains in Ferroelectrics
… techniques accompanied by relevant theory and AFM techniques.<br/>The study on polycrystalline BaTiO<sub>3</sub> (FIB lamellae) aims to further understand the link between domains coupling across adjacent grains and to explore the domains’ re-ordering as a function of heating through …
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Conjugated Polymer Brushes (Poly(3-hexylthiophene) brushes): new electro- and photo-active molecular architectures
… (RBS), and Conductive atomic force microscopy (C-AFM). The obtained data suggests that the grafting process occurs not only at the poly(4-bromostyrene), PS-Br/polymerization solution interface, but also deeply inside the swollen PS-Br film, which is penetrable for the catalyst and the monomer. The …
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Charged domain wall phenomena and associated negative capacitance in boracites
… such as conducting Atomic Force Microscopy (c-AFM) and Piezoresponse Force Microscopy (PFM) to determine that domain walls with an associated dc conductivity distinct from the bulk are caused by two types of polar discontinuity: 90° tail-tail conducting or 90° head-head insulating.<br/><br/>The …
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Ultra-thin boron nitride films by pulsed laser deposition: Plasma diagnostics, synthesis, and device transport
… substrate. Conductive atomic force microscopy (C-AFM) measurements of electron tunneling behavior depict a uniform The reduction in deposition temperature and formation of stoichiometric, large-area <em>h</em>-BN films by PLD provides a process that is easily scaled-up for two-dimensional …
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Eterostrutture di Disolfuro di Molibdeno: preparazione e trasporto elettronico
… come il Microscopio a Forza Atomica (AFM) e l’AFM in modalità conduttiva (C-AFM), il Microscopio a Trasmissione Elettronica (TEM), Raman, Fotoluminescenza e Spettroscopia fotoelettronica a raggi X (XPS). Verranno discussi gli approcci sviluppati sperimentalmente per esfoliare membrane …
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Understanding and engineering electronic and optoelectronic properties of 2D materials and their interfaces
… spectral atomic force microscopy (C- and PCS-AFM). The layer number dependence of the effective barrier was measured, by obtaining consecutive current images while changing bias voltages, showing it to be linear. At the same time, spatially resolved two-dimensional (2D) maps of local …