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Showing 1 to 5 of 5 for “"beam particles"”.

  1. Penning ionization studies using a crossed-beam technique

    A modulated crossed-beam apparatus for the investigation of Penning ionization at thermal energies has been designed and constructed. Details are given for the production of a beam of helium metastable atoms by electron impact excitation. The production of well-collimated neutral beams of stable …

    rice Repository record for Penning ionization studies using a crossed-beam technique (opens in a new tab)

  2. A search for heavy leptons using a differential Cherenkov counter

    … differential Cherenkov counter to identify known beam particles and place upper limits on the abundance of other particles in the beam. The details of the design and performance of this Cherenkov counter are given. Heavy leptons of mass near the K meson mass were sought by looking for anomalous …

    uiuc Repository record for A search for heavy leptons using a differential Cherenkov counter (opens in a new tab)

  3. Normal Mode Analysis Of Single Bunch, Charge Density Dependent Behavior In Electron/Positron Beams

    … dynamics are not a sufficient description of beam behavior and interactions between the beam particles must be taken into account. One such interaction is when collisions between the particles that compose a bunch perturb the motion of the colliding particles significantly and frequently …

    cornell Repository record for Normal Mode Analysis Of Single Bunch, Charge Density Dependent Behavior In Electron/Positron Beams (opens in a new tab)

  4. Exclusive pi0 production at HERMES: detection - simulation - analysis

    … fully known. In the Hermes experiment 27.5 GeV beam particles are scattered off an internal gas target. To improve the measurement of exclusive reactions a recoil detector surrounding the target cell was designed and built to deremine exclusivity at the event level and to measure the kinematics …

    ghent Repository record for Exclusive pi0 production at HERMES: detection - simulation - analysis (opens in a new tab)

  5. Sub-10-nm lithography with light-ion beams

    Scanning-electron-beam lithography (SEBL) is the workhorse of nanoscale lithography in part because of the high brightness of the Schottky source of electrons, but also benefiting from decades of incremental innovation and engineering of apparatus around the Schottky source. Light ions are an …

    mit Repository record for Sub-10-nm lithography with light-ion beams (opens in a new tab)