Global ETD Search
Search theses and dissertations gathered from participating repositories worldwide. Every result links back to the library that holds it. No account is needed.
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Showing 1 to 20 of 36 for “"atpg"”.
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On Enhancing Deterministic Sequential ATPG
… circuit Automatic Test Patterns Generators (ATPG). Three techniques make use of information gathered during test generation to help identify more unjustifiable states with higher percentage of "don't care" value. An approach for reducing the search space of the ATPG was introduced. The …
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ATPG and DFT Algorithms for Delay Fault Testing
… efficient Automatic Test Pattern Generation (ATPG) and Design-for-testability (DFT) algorithms for delay testing. In the dissertation, two algorithms are first proposed for computing and applying transition test patterns using stuck-at test vectors, thus avoiding the need for a transition …
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High Quality Transition and Small Delay Fault ATPG
… delay defects. Furthermore, non-robust paths for ATPG are filtered (selected) carefully so that there is a minimum overlap with the already tested robust paths. A relationship between path delay fault model and transition fault model has been observed which helps us reduce the number of non-robust …
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TENOR: an ATPG for transition faults in combinational circuits
… presents an Automatic Test Pattern Generator (ATPG), called TENOR, for transition faults. Transition faults are a special case of gate delay faults. Test generation is based on the FAN algorithm. The approach taken in this thesis is to map a transition fault into two stuck-at faults, and then …
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ATPG based Preimage Computation: Efficient Search Space Pruning using ZBDD
… up in terms of memory. On the other hand, SAT/ATPG based methods are less demanding on memory. But the run-time can be huge for these methods, since they must explore an exponential search space. In order to reduce this temporal explosion of SAT/ATPG based methods, efficient learning techniques …
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Fast Static Learning and Inductive Reasoning with Applications to ATPG Problems
… untestable fault identification and to constrain ATPG for path delay fault testing, with positive results.
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Identification and Analysis of Illegal States in the Apoptotic Discrete Transition System Model using ATPG and SAT-based Techniques
… In this thesis, we propose techniques based on ATPG and SAT based image computation of the Apoptosis finite transition model. Our method leverages the results obtained in previous research work. It uses the reachable states obtained from the simulation traces of the previous work as initial …
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State Information-Based Solutions for Sequential Circuit Diagnosis and Testing
… untestability identification by practical ATPG algorithms is vital to areas such as ATPG-based optimization and ATPG-based verification. This research provides conditions based on the state properties of the good and the faulty machines involved to ensure that the behavior of the circuit in …
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Search State Extensibility based Learning Framework for Model Checking and Test Generation
… generated by Automatic Test Pattern Generation (ATPG) techniques, which assume certain fault types to model arbitrary defects. The size of fault list and test set has a major impact on the economics of manufacturing test. Towards this end, we propose a fault col lapsing approach to compact the …
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Exploring Temporal and Spatial Correlations on Circuit Variables for Enhancing Simulation-based Test Generation
… Design Verification and Testing: Sequential ATPG (Automatic Test Pattern Generation), Unbounded Model Checking (UMC) of safety properties, and low power testing for full-scan sequential circuits. We model these three problems as simulation-based pattern generation problems and exploit novel …
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Architectural Level Test Generation and Fault Simulation
… this thesis, a high level branch-and-bound based ATPG approach will be first presented. This method is a reasonable extension of the gate level ATPG approaches. Although various effective techniques have been applied, this method has sluggish performance for circuits with complicated data path or …
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Search-space Aware Learning Techniques for Unbounded Model Checking and Path Delay Testing
… we exploit Automatic Test Pattern Generation (ATPG) for Unbounded Model Checking (UMC). In order to perform unbounded model checking, we need the core image / preimage computation engines that perform forward / backward reachability analysis. First, we develop an ATPG engine, with search-space …
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Symbolic methods for testing digital circuits
… and automated test pattern generation (ATPG), have been examined, among others, like build-in self-test, computing reset sequences for a sequential circuit, identifying uninitializable memory elements, or computing approximations for signal probabilities for sequential circuits.
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Design for Testability Techniques to Optimize VLSI Test Cost
… an a-priori automatic test pattern generation (ATPG) run. In this thesis, we present novel low cost techniques to construct ILS scan configuration for a given design. These techniques efficiently utilize the circuit topology information and try to optimize the flip-flop assignment to a scan …
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COPING WITH DISCREPANCIES OF THE MANUFACTURED WEIGHTS IN THRESHOLD LOGIC GATES
… Also an Automatic Test Pattern Generation (ATPG) tool has been implemented that uses the fault model to detect whether the circuit is malfunctioning due to such weight-related defects. A novel design methodology is presented in this work to design complex TLG networks that are tolerant to …
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Reachability Analysis of RTL Circuits Using k-Induction Bounded Model Checking and Test Vector Compaction
… on test set generated during simulation based ATPG. Starting with a compaction framework for storing metadata and about the test vectors during generation, this work presented to methods for findind the solution of this compaction problem. The first of these two methods generate the optimum …
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Untestable Fault Identification Using Implications
… automatic test pattern generators (ATPGs) spend a lot of time in trying to generate a test sequence for the detection of untestable faults, before aborting on them, or identifying them as untestable, given enough time. Thus, it would be beneficial to quickly identify faults that are …
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Design Verification for Sequential Systems at Various Abstraction Levels
… likely to succeed, we developed an efficient ATPG-based validation framework, which leverages the high-level circuit information and an improved observability-enhanced coverage to generate high quality validation sequences. Experiments show that our approach is able to generate high quality …
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Selection of flip-flops for partial scan design
… a sequential automatic test pattern generator (ATPG) are targeted in ETA and the requirements for the detection of the faults are used for the selection of scan flip-flops. The Extended Tracking Algorithm is realized in two different algorithms, optimal and heuristic, depending on the …
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Fault simulation and test pattern generation for synchronous and asynchronous sequential circuits
… and an autolllatic test pattern generator (ATPG), called ATHENA, for synchronous and asynchronous sequential circuits. HOPE is a parallel fault simulator for synchronous sequential circuits. In HOPE, a packet of 32 faults is simulated in parallel. Several new heuristics are employed in HOPE …
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