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  1. Fluctuation Electron Microscopy of Medium-Range Order in Amorphous Silicon

    Fluctuation electron microscopy is a transmission electron microscopy technique for studying medium-range order in disordered materials. We compute the variance for the image intensity of low-resolution hollow-cone dark field electron micrographs as a function of the diffracting condition and …

    uiuc Repository record for Fluctuation Electron Microscopy of Medium-Range Order in Amorphous Silicon (opens in a new tab)