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Showing 1 to 1 of 1 for “"aging evaluation"”.
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In-situ impedance characterization for assessing SiC MOSFETs reliability
… resistance and package inductance. Accelerated aging experiments confirm that on-state resistance correlates with gate-oxide degradation, while bond-wire lift-off leads to a measurable increase in package inductance. The circuit is thus capable of simultaneously tracking both degradation modes. …