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Showing 1 to 1 of 1 for “"ZVS figure of merit"”.
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Output Capacitance Loss Measurement and Validation for Low-Voltage Silicon and GaN Devices in DC-DC Converter Applications
With the rise of soft-switched converter topologies which enable high-frequency power conversion, there has been a premise that these converter topologies can help achieve loss-less switching in a power device. However, this theory is not completely true as there even with soft-switching there is …