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Showing 1 to 4 of 4 for “"Z-Contrast"”.

  1. Dry magnetic assisted impaction mixing of sub-micron boron and barium chromate for a time delay composition

    … with an ESB detector which provides higher Z contrast at extremely low accelerating voltage, resulting in higher spatial resolution and other systems such as Particle Size Analyzer (LS-230). The results indicate that the new MAIM techniques produces a mixture with a significantly improved …

    njit Repository record for Dry magnetic assisted impaction mixing of sub-micron boron and barium chromate for a time delay composition (opens in a new tab)

  2. Quantitative High-angle Annular Dark Field Scanning Transmission To Electron Microscopy For Materials Science

    … (HAADF) STEM imaging using atomic number (Z) contrast has proven capable of resolving atomic structures with better than 2 A lateral resolution. In this work, the HAADF STEM imaging mode is used in combination with multislice simulations. This combination is applied to the investigation of the …

    ucf

  3. LARGE-AREA, WAFER-SCALE EPITAXIAL GROWTH OF GERMANIUM ON SILICON AND INTEGRATION OF HIGH-PERFORMANCE TRANSISTORS

    … of the Si substrate before Ge epitaxy begins. Z-contrast cross-sectional TEM images suggest the presence of oxygen precipitates in n-type Ge, whereas these precipitates appear absent in p-type Ge. These oxygen precipitates are known to lock the dislocations. Supporting the argument of precipitate …

    unm Repository record for LARGE-AREA, WAFER-SCALE EPITAXIAL GROWTH OF GERMANIUM ON SILICON AND INTEGRATION OF HIGH-PERFORMANCE TRANSISTORS (opens in a new tab)

  4. Nucleation and Growth of Defects in Nitrogen doped Silicon

    Ultra high purity silicon is advantageously modified by as low as 5x10¹⁴ cm⁻³ nitrogen. Such a doping level was proved to drastically impact grown-in and process-induced defects, enhances the denuded zone intended for making devices, improves impurity gettering, and increases the gate oxide …

    ncsu Repository record for Nucleation and Growth of Defects in Nitrogen doped Silicon (opens in a new tab)