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Showing 1 to 2 of 2 for “"Xerography"”.
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Investigation of the suitability of amorphous semiconductors as sensors for optical process tomography
… arrays. The study comprised of the two fields of xerography and tomography. The xerographic study comprised of the measurement of such parameters as charge acceptance, dark decay, residual potential, and photoinduced discharge. The research project has concurred with other workers in that the dark …