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Showing 1 to 20 of 21 for “"XRR"”.
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Structural Characterization of the Interfacial Structure of the Working Electrode in Dye-sensitized Solar Cells Using X-ray and Neutron Techniques
… provide an introduction to X-ray reflectometry (XRR) and neutron reflectometry (NR) techniques, i.e., the principal analytic tools used for research carried out in the context of this thesis. Chapters 3, 4, and 5 contain the results obtained from applying ex-situ air-solid X-ray techniques to …
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Adsorption of organic friction modifiers at static and sheared interfaces
… reflectometry (NR) and X-ray reflectometry (XRR). The tribometer can apply shear to an interface at rates of up to 3.8 x 103 s-1 and the thicknesses of thin films adsorbed at the interface can be determined via NR or XRR. The details of the tribometer are described in Chapter 2. Chapter 3 …
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Fabrication and characterization of multilayers for focusing hard x-ray optics
… their characterization by x-ray reflectivity (XRR) measurements. The width of the interfaces was identified as the most important factor that must be controlled and minimized to achieve high reflectivity. The optimization of the process parameters led to interface widths ([sigma]) of 3.0-4.5 …
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Design and synthesis of a new polymer: study of supramolecular structure and functional properties
… sono stati condotti mediante tecniche AFM e XRR ed hanno evidenziato la persistenza delle specie supramolecolari anche allo stato solido. L'influenza della struttura su proprietà elettriche è stata studiata mediante l'uso di diodi che simulano celle solari.
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Synthesis and characterization of plasma enhanced chemically vapor deposited tantalum films
… microscopy (SEM), and x-ray reflectivity (XRR). The hydrogen concentration was detected by NRA. These studies indicated that a phase predominant Ta coatings with traces of oxygen, carbon, chlorine, and hydrogen were deposited by PECVD method. The coatings properties had been investigated in …
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Growth, structure and morphology of organic thin films
… to produce amorphous film. Subsequently, XRD and XRR have been employed to investigate film morphology and structural properties. The thermal stability of the film was examined by In situ heating-XRR technique.
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Optical modeling off-stoichiometric amorphous Al2O3 thin films deposited by reactive sputtering
… thickness was measured by X-ray reflectivity (XRR), and the inevitable surface roughness of the films was examined by atomic force microscopy (AFM). Both techniques (XRR and AFM) were useful because they allowed us to make good initial guesses (in ellipsometry) for the film thickness and the …
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Predicting the structure and performance of dye-sensitized solar cells by computational methods.
… for DSC fabrication. X-ray reflectometry (XRR) had been used by a collaborator to investigate monolayer thicknesses and densities as they grow under different conditions in the DSC fabrication process. This author trained a neural network to perform rapid, deterministic fitting of 360 …
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Self-Assembled Host-Guest Thin Films for Functional Interfaces
… diffraction (GIXD), specular X-ray reflectivity (XRR) and transfer ratio measurements were used to characterize the crystallinity, film thickness, overall film stability and film coverage. The GIXD data revealed that the crystallinity of the deposited film varies with the "guest" molecules and can …
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Magnetization Dynamics in Ultrathin Films and Multilayers
… X-ray diffraction (XRD) and X-ray reflectivity (XRR) measurements. These films are particularly interesting because of their well known superior magnetostrictive behavior. Motivated from previous FMR experiments in IrMn/CoFe and MnN/CoFeB exchange bias systems, we investigated the anisotropic …
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Multilayered ZnO-based thin films to control heat and electrical transport properties
… The films are analysed with x-ray reflectivity (XRR), x-ray diffraction (XRD) and transmission electron microscopy (TEM) in regards to their internal structure. Time domain thermoreflectance (TDTR) is utilized to measure the thermal conductivity, the electrical properties are measured with a hall …
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Design and Development of Novel Atomic Layer Deposition Equipment & Processes for Biomedical Applications
… films were also measured using X-Ray Reflection (XRR). Mechanical testing included measurement of the tensile strength of the material before and after deposition. Leaching of the coated material in Phosphate Buffer Solution (PBS) was also studied using Inductively Coupled Plasma- Quadrupole Mass …
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Characterization of amorphous silicon carbide and silicon carbonitride thin films synthesized by polymer-source chemical vapor deposition mechanical structural and metal-interface properties
… while X-ray reflectivity measurements (XRR) were used to account for the film density. Spectral deconvolution was used to extract the individual components of the FTIR and XPS spectra. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) were also employed to characterize …
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Organic Electronics by Self-Assembly
… on top of aluminium oxide. X-ray reflectivity (XRR) measurements confirmed the expected three regions, endcapper, semiconducting core, and spacer, perpendicularly ordered to the surface. In plane order was investigated by grazing incidence measurements (GIXD), which resulted in a …
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Untersuchung gasochrom schaltender Wolframoxide
… characterize the coatings, X-ray reflectometry (XRR), optical spectroscopy and in-situ time resolved spectroscopy were mainly used. The determination of relevant physical properties like density, thickness and roughness or the dielectric function (DF) (<--> index of refraction and absorption …
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Influence of deposition parameters on morphology, growth and structure of crystalline and amorphous organic thin films : (the case of perylene and alpha-NPD)
… Subsequently, AFM and X-ray reflectometry (XRR) have been employed to investigate film morphology and structural properties.
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Fabrication and Characterization of Silicon Rich Oxide (SRO) Thin Film Deposited by Plasma Enhanced CVD for Si Quantum Dot
… Si crystallization. X-Ray Reflectivity (XRR) was the main approach to determine thin film thickness. X-Ray Diffraction (XRD) and Ramam spectroscopy were applied for the determination of the Si nano-crystal structure. Further improvements for the PECVD thin film deposition and the SRO …
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Schaltbare optische Schichten : vom atomistischen Verständnis des gasochromen Schaltens von Wolframoxid zur industriellen Anwendung
… bleached film before coloration again. In-situ XRR-analysis confirmed this result for the variation of the film thickness. Spectroscopic in-situ analysis in the near infrared region detect a strong increase of the amount of water during coloration in hydrogen containing atmosphere. It does not …
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Correlative ex-situ analysis and operando ellipsometric investigation during oxygen evolution reaction of mesoporous iridium oxide model catalysts
… electron microscopy (SEM), X-ray reflectometry (XRR), conductivity measurements, and UV-VIS-NIR absorption spectroscopy. SE data also offer the possibility to derive valence electron energy loss spectra (VEELS), which provide further information about the electronic structure of the materials. …
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Investigation of physical properties of mesoporous NANO-Ti02 for dye-solar
… using Scherer's equation. X-ray reflectivity (XRR) and grazing incidence small angle x-ray scattering were used to follow the order and disorder in the formation of the mesoporous nano-structured TiO2 and also to track the evolution of the films structure before and after calcinations. Optical …
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