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Showing 1 to 20 of 1934 for “"X-ray Diffraction"”.

  1. Coherent X -Ray Diffraction

    … derived from the kinematical formulation for x-ray diffraction and from the temporal and spatial coherence of radiation. The antiphase domain structure of Cu 3Au is described, along with the associated reciprocal-space structure which is measured by CXD. CXD measurements place relatively …

    uiuc Repository record for Coherent X -Ray Diffraction (opens in a new tab)

  2. Coherent x-ray diffraction

    Submitted by Meng Tao (mengtao2@illinois.edu) on 2012-10-26T22:51:05Z No. of bitstreams: 1 pitney_John.pdf: 12626202 bytes, checksum: 0a4edb5141b145027d659f789e1e8679 (MD5)

    uiuc Repository record for Coherent x-ray diffraction (opens in a new tab)

  3. X -Ray Diffraction Rotational Microrheology

    … single particle tracking. The technique of X-ray diffraction rotational tracking has the ability to track the rotational motion of single crystals to a resolution of 80murad with a time resolution of 0.02 seconds. Rotational microrheology studies of single crystal Alumina tracer particles …

    uiuc Repository record for X -Ray Diffraction Rotational Microrheology (opens in a new tab)

  4. X-ray diffraction by elastically deformed crystals

    Thesis (Ph.D.) Massachusetts Institute of Technology. Dept. of Physics, 1949.

    mit Repository record for X-ray diffraction by elastically deformed crystals (opens in a new tab)

  5. X-ray diffraction from point-like imperfection

    … from point-like defects are investigated by x-ray diffraction. The atomic volume changes in the interstitial compounds using crystallographic information has been found to correlate with the size of filled octahedral sites. Systematic correlations enable estimates to be made of the components …

    vt Repository record for X-ray diffraction from point-like imperfection (opens in a new tab)

  6. X-Ray Diffraction Studies of Palladium-Silicide Thin Films

    … on Si(lll) substrates has been studied using X-ray diffraction techniques. In situ layer growth kinetics were measured over a temperature range of 160-222(DEGREES)C using an X-ray integrated intensity approach. Mosaic structure and impurity levels were analyzed. The film stresses in Pd(,2)Si …

    uiuc Repository record for X-Ray Diffraction Studies of Palladium-Silicide Thin Films (opens in a new tab)

  7. X-ray diffraction study of aged copper beryllium alloys

    X-ray polycrystalline diffraction techniques are used to determined the defect structure in a commercial Cu-l1.55 at. %Be-O.23 at. %Co alloy during low temperature aging. The analysis of the X-ray diffraction patterns is aided by the computer modeling of the defects inside the crystals using an …

    vt Repository record for X-ray diffraction study of aged copper beryllium alloys (opens in a new tab)

  8. X-ray diffraction of a gram-negative bacterial membrane mimetic

    This thesis applies x-ray diffraction to measure he membrane structure of lipopolysaccharides and to develop a better model of a LPS bacterial melilbrane that can be used for biophysical research on antibiotics that attack cell membranes. \iVe ha'e Inodified the Physics department x-ray machine for …

    brock Repository record for X-ray diffraction of a gram-negative bacterial membrane mimetic (opens in a new tab)

  9. Electron Microprobe and X-Ray Diffraction Study of Natural Idocrase

    Made available in DSpace on 2014-12-11T18:09:57Z (GMT). No. of bitstreams: 1 7207078.pdf: 3037853 bytes, checksum: aafc716a41bd573f1db649c5d11795f2 (MD5) Previous issue date: 1971

    uiuc Repository record for Electron Microprobe and X-Ray Diffraction Study of Natural Idocrase (opens in a new tab)

  10. Structural Studies of Lead Nanocrystals Using Coherent X-ray Diffraction

    Submitted by Meng Tao (mengtao2@illinois.edu) on 2012-10-26T22:18:59Z No. of bitstreams: 1 Pfeifer_Mark.pdf: 30178565 bytes, checksum: 6d5322e99ba7b6f41f2ca394d766f439 (MD5)

    uiuc Repository record for Structural Studies of Lead Nanocrystals Using Coherent X-ray Diffraction (opens in a new tab)

  11. X-ray diffraction study of compressed solid argon and krypton

    … and applied both to obtain very precise x-ray lattice parameters along the melting curves of solid argon and solid krypton and to measure changes in vacancy concentrations along quasi-isochores for both these substances. The uncertainty of the lattice parameters obtained along melting was …

    uiuc Repository record for X-ray diffraction study of compressed solid argon and krypton (opens in a new tab)

  12. Materials discovery using in situ reduction and X-ray diffraction

    … use of in situ reduction reactions and X-ray diffraction to quickly explore compositional space. Reduction reactions provide a synthesis route that has been shown to gently traverse a compositional space. Traditional synthesis at high temperatures tends to only favor the formation of …

    uiuc Repository record for Materials discovery using in situ reduction and X-ray diffraction (opens in a new tab)

  13. X-ray diffraction study of a three-component lamellar phase

    Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Physics, 1995.

    mit Repository record for X-ray diffraction study of a three-component lamellar phase (opens in a new tab)

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