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Showing 1 to 1 of 1 for “"WCDM2"”.
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Charged device model electrostatic discharge protection and test methods for integrated circuits
… nodes during the stress event. The third, named “WCDM2,” is an improvement upon WCDM. The merits and drawbacks of each of these testers are examined in this work. Primarily, this work seeks to methodically answer the outstanding question of whether or not wafer-level CDM testing can replicate …