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Showing 1 to 1 of 1 for “"Voronoi volume analysis"”.
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Topological Characterization of Amorphous Silicon Structures Using Voronoi-Volume Analysis
… properties of amorphous silicon (a-Si) through Voronoi volume analysis. Amorphous silicon exhibits a lack of long-range ordering, which leads to topological disorder, and it affects the atomic structure. Voronoi volumes of different a-Si structures have been measured by using Monte Carlo …