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Showing 1 to 20 of 30 for “"Very-large-scale integration (VLSI)"”.

  1. Use of architectural-level primitives in system-level diagnosis and speed up of test vector generation

    … are used during the design, manufacture, system integration, and throughout the life-cycle of the circuit in order to detect the presence of defects. The very large scale integration (VLSI) test generation problem has been one of the most complex and time-consuming problems. This is a major …

    uiuc Repository record for Use of architectural-level primitives in system-level diagnosis and speed up of test vector generation (opens in a new tab)

  2. A nano-CMOS based universal voltage level converter for multi-VDD SoCs.

    … circuits is the most demanding issue for very large scale integration (VLSI) design engineers, especially for portable and mobile applications. Use of multiple supply voltages systems, which employs level converter between two voltage islands is one of the most effective ways to reduce …

    unt Repository record for A nano-CMOS based universal voltage level converter for multi-VDD SoCs. (opens in a new tab)

  3. High Performance Architecture using Speculative Threads and Dynamic Memory Management Hardware

    With the advances in very large scale integration (VLSI) technology, hundreds of billions of transistors can be packed into a single chip. With the increased hardware budget, how to take advantage of available hardware resources becomes an important research area. Some researchers have shifted from …

    unt Repository record for High Performance Architecture using Speculative Threads and Dynamic Memory Management Hardware (opens in a new tab)

  4. Packaging solution for VLSI electronic photonic chips

    … requirement. Hence, an increasing number of Very-Large-Scale Integration (VLSI) electronic photonic chips are going to be designed and utilized. However, packaging for the chip is one of the major challenges for optoelectronic industry to overcome due to its high cost and lack of standards. …

    mit Repository record for Packaging solution for VLSI electronic photonic chips (opens in a new tab)

  5. A low dispersion 2-GHz comparator

    … is an essential part of the latest automated VLSI tester by Teradyne Inc. With each new and faster CMOS logic VLSI microchips, faster and more precise comparators are needed to verify that the static discipline is being met on the many pins of the integrated circuit. As the error in the …

    mit Repository record for A low dispersion 2-GHz comparator (opens in a new tab)

  6. Hierarchical test generation for CMOS circuits

    As advances in very large scale integration (VLSI) technology lead to higher levels of circuit integration and new design styles and fabrication processes, traditional test generation techniques fail to adequately address the problems of how to (l) accurately represent the structure of design …

    vt Repository record for Hierarchical test generation for CMOS circuits (opens in a new tab)

  7. The Dual Use of Power Distribution Networks for Data Communications in High Speed Integrated Circuits

    … As the power consumption increases for very large scale integration (VLSI) systems, the number of power/ground pins increases as well. In this thesis, we propose to use PDNs for dual purposes, delivery of power and one-/two-way data communications, which is highly beneficial for …

    vt Repository record for The Dual Use of Power Distribution Networks for Data Communications in High Speed Integrated Circuits (opens in a new tab)

  8. A cost quality model for CMOS IC design

    With a decreasing minimum feature size in very large scale integration (VLSI) complementary metal oxide semiconductor (CMOS) technology, the number of transistors that can be integrated on a single chip is increasing rapidly. Ensuring that these extremely dense chips are almost free of defects, and …

    vt Repository record for A cost quality model for CMOS IC design (opens in a new tab)

  9. Modern VLSI Placement Observing Technology Constraints

    … imposed by modern technology processes on the Very Large Scale Integration (VLSI) design process. Any constraint not only makes the placement problem challenging; but also can degrade the quality of the objectives optimized during the placement process or other steps in the physical design …

    calgary Repository record for Modern VLSI Placement Observing Technology Constraints (opens in a new tab)

  10. Development of a high-density, off-line, quasi-resonant converter using hybrid techniques

    The advancement of Very Large Scale Integration (VLSI) technology has reduced the size and increased the speed of information processing circuits. Consequently, power supplies for such circuits have had to meet increasing demands for power, yet simultaneously decrease in size. This need for higher …

    vt Repository record for Development of a high-density, off-line, quasi-resonant converter using hybrid techniques (opens in a new tab)

  11. Static analysis for circuit families

    … of transistors on a chip has roughly doubled every two years. Microprocessors featuring over a billion transistors are no longer science fiction. For example, Intel's Itanium 9000 series and Intel's Xeon 7400 series of processors feature 1.7 and 1.9 billion transistors respectively. To keep up …

    rice Repository record for Static analysis for circuit families (opens in a new tab)

  12. Graphene-coated substrates for biochemical and optoelectronic applications

    … -- has proven to possess remarkable properties: large thermal conductivity, mechanical robustness, two-dimensional ultra large electronic mobility, chemical inertness and biochemical compatibility. Realization of some applications has been impeded by lack of a large area deposition method. By …

    njit Repository record for Graphene-coated substrates for biochemical and optoelectronic applications (opens in a new tab)

  13. Open collaborative system design : a strategic framework with application to synthetic biology

    … through an in-depth case study of the opening of Very Large Scale Integration (VLSI) in the semi-conductor industry in the late 1970s. Finally, a quantitative method is developed to guide the design of open standards within one of the three strategies. These three contributions - the framework, …

    mit Repository record for Open collaborative system design : a strategic framework with application to synthetic biology (opens in a new tab)

  14. Advances in parallel programming for electronic design automation

    … which makes it easier for users to construct large and complex parallel patterns. Third, we add a new task type in Cpp-Taskflow to let users control the graph execution flow. This feature empowers the graph model with the ability to describe complex control flow. Aside from the above …

    uiuc Repository record for Advances in parallel programming for electronic design automation (opens in a new tab)

  15. Multiphase Voltage Regulator Modules with Magnetic Integration to Power Microprocessors

    Advances in very large scale integration (VLSI) technologies impose challenges for voltage regulator modules (VRM) to deliver high-quality power to modern microprocessors. As an enabling technology, multiphase converters have become the standard practice in VRM industry. The primary objectives of …

    vt Repository record for Multiphase Voltage Regulator Modules with Magnetic Integration to Power Microprocessors (opens in a new tab)

  16. Full Custom VLSI Design of On-Line Stability Checkers

    … (CUT). This thesis describes the full custom very-large-scale integration (VLSI) design and testing process of On-Line Stability Checkers. The goals of this thesis are to construct and test Stability Checker designs, and to create a design template for future class projects in the EE 431 …

    calpoly Repository record for Full Custom VLSI Design of On-Line Stability Checkers (opens in a new tab)

  17. Dislocation related defects in silicon and gallium nitride.

    … free, but dislocations may be introduced in very-large scale integration (VLSI) to act as impurity gettering centres. Additionally, the interstitial oxygen inherent in Czochralski (Cz) silicon can be made to segregate to dislocation cores by specific bending and annealing conditions to …

    sheffield-hallam Repository record for Dislocation related defects in silicon and gallium nitride. (opens in a new tab)

  18. Design and demonstration of integrated micro-electro-mechanical relay circuits for VLSI applications

    … as an alternative switching technology for very-large scale integration (VLSI) applications. In the first part of this thesis, the feasibility of MEM relays for power management applications is discussed. Due to their negligibly low leakage, in certain applications, chips utilizing power …

    mit Repository record for Design and demonstration of integrated micro-electro-mechanical relay circuits for VLSI applications (opens in a new tab)

  19. Acceleration of Hardware Testing and Validation Algorithms using Graphics Processing Units

    With the advances of very large scale integration (VLSI) technology, the feature size has been shrinking steadily together with the increase in the design complexity of logic circuits. As a result, the efforts taken for designing, testing, and debugging digital systems have increased tremendously. …

    vt Repository record for Acceleration of Hardware Testing and Validation Algorithms using Graphics Processing Units (opens in a new tab)

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